| Behavioral modeling of SRIM tables for numerical simulation S Martinie, T Saad-Saoud, S Moindjie, D Munteanu, JL Autran Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014 | 34 | 2014 |
| Characterization of atmospheric muons at sea level using a cosmic ray telescope JL Autran, D Munteanu, TS Saoud, S Moindjie Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2018 | 23 | 2018 |
| ASTEP (2005–2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure JL Autran, D Munteanu, S Moindjie, TS Saoud, S Sauze, G Gasiot, ... Microelectronics Reliability 55 (9-10), 1506-1511, 2015 | 13 | 2015 |
| Use of CCD to detect terrestrial cosmic rays at ground level: altitude vs. underground experiments, modeling and numerical Monte Carlo simulation TS Saoud, S Moindjie, JL Autran, D Munteanu, F Wrobel, F Saigné, ... IEEE Transactions on Nuclear Science 61 (6), 3380-3388, 2014 | 11 | 2014 |
| Single-event-transient effects in Junctionless Double-Gate MOSFETs with Dual-Material Gate investigated by 3D simulation D Munteanu, JL Autran, S Moindjie Microelectronics Reliability 76, 719-724, 2017 | 9 | 2017 |
| Charge collection physical modeling for soft error rate computational simulation in digital circuits JL Autran, D Munteanu, S Moindjie, TS Saoud, V Malherbe, G Gasiot, ... Modeling and Simulation in Engineering Sciences, 115-137, 2016 | 6 | 2016 |
| Origin of high total dose sensitivity on the OP400 bipolar operational amplifier MF Bernard, L Dusseau, S Moindjie, T Bouchet IEEE Transactions on Nuclear Science 55 (6), 3224-3230, 2008 | 6 | 2008 |
| Real-time characterization of neutron-induced SEUs in fusion experiments at WEST Tokamak during DD plasma operation JL Autran, S Moindjie, D Munteanu, M Dentan, P Moreau, FP Pellissier, ... IEEE Transactions on Nuclear Science 69 (3), 501-511, 2022 | 5 | 2022 |
| Natural radiation events in ccd imagers at ground level TS Saoud, S Moindjie, D Munteanu, JL Autran Microelectronics Reliability 64, 68-72, 2016 | 5 | 2016 |
| Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMs S Moindjie, JL Autran, D Munteanu, G Gasiot, P Roche Microelectronics Reliability 76, 53-57, 2017 | 4 | 2017 |
| Modelling and simulation of SEU in bulk Si and Ge SRAM S Moindjie, D Munteanu, JL Autran Microelectronics Reliability 100, 113390, 2019 | 3 | 2019 |
| Real-time soft error rate measurements on bulk 40 nm SRAM memories: a five-year dual-site experiment JL Autran, D Munteanu, S Moindjie, TS Saoud, G Gasiot, P Roche Semiconductor Science and Technology 31 (11), 114003, 2016 | 3 | 2016 |
| A water tank muon spectrometer for the characterization of low energy atmospheric muons D Munteanu, S Moindjie, JL Autran Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2019 | 2 | 2019 |
| Preliminary study of electronics reliability in ITER neutron environment M Dentan, G Borgese, JL Autran, D Munteanu, S Moindjie, J Bucalossi, ... 2022 22nd European Conference on Radiation and Its Effects on Components and …, 2022 | 1 | 2022 |
| Fusion Neutron-Induced Soft Errors During Long Pulse DD Plasma Discharges in the WEST Tokamak S Moindjie, D Munteanu, JL Autran, M Dentan, P Moreau, FP Pellissier, ... IEEE Transactions on Nuclear Science, 2024 | | 2024 |
| Impact of total ionizing dose on the alpha-soft error rate in FDSOI 28 nm SRAMs S Moindjie, D Munteanu, JL Autran, V Malherbe, G Gasiot, P Roche Microelectronics Reliability 150, 115181, 2023 | | 2023 |
| Basic single-event mechanisms in Ge-based nanoelectronics subjected to terrestrial atmospheric neutrons D Munteanu, S Moindjie, JL Autran Microelectronics Reliability 126, 114256, 2021 | | 2021 |
| Real-Time Characterization of Neutron-induced SEUs in Fusion Experiment at WEST Tokamak during DD Plasma Operation S Moindjie, D Munteanu, M Dentan, P Moreau, FP Pellissier, J Bucalossi, ... IEEE Nuclear and Space Radiation Effects Conference (NSREC 2021), 2021 | | 2021 |
| 12 Natural Radiation Effects in CCD Devices TS Saoud, S Moindjie, D Munteanu, JL Autran Ionizing Radiation Effects in Electronics: From Memories to Imagers, 333, 2018 | | 2018 |
| Multi-Poisson Process Analysis of Real-Time Soft-Error Rate Measurements in Bulk 65nm SRAMs S Moindjie, JL Autran, D Munteanu, G Gasiot, P Roche 28th European Symposium on Reliability of Electron Devices, Failure Physics …, 2017 | | 2017 |
