Josep Altet
Josep Altet
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Cited by
Cited by
Dynamic surface temperature measurements in ICs
J Altet, W Claeys, S Dilhaire, A Rubio
Proceedings of the IEEE 94 (8), 1519-1533, 2006
Thermal coupling in integrated circuits: application to thermal testing
J Altet, A Rubio, E Schaub, S Dilhaire, W Claeys
IEEE Journal of Solid-State Circuits 36 (1), 81-91, 2001
Four different approaches for the measurement of IC surface temperature: application to thermal testing
J Altet, S Dilhaire, S Volz, JM Rampnoux, A Rubio, S Grauby, LDP Lopez, ...
Microelectronics journal 33 (9), 689-696, 2002
Thermal testing of integrated circuits
J Altet, A Rubio
Springer Science & Business Media, 2002
Electrothermal design procedure to observe RF circuit power and linearity characteristics with a homodyne differential temperature sensor
M Onabajo, J Altet, E Aldrete-Vidrio, D Mateo, J Silva-Martinez
IEEE Transactions on Circuits and Systems I: Regular Papers 58 (3), 458-469, 2010
Defect-oriented non-intrusive RF test using on-chip temperature sensors
L Abdallah, HG Stratigopoulos, S Mir, J Altet
2013 IEEE 31st VLSI Test Symposium (VTS), 1-6, 2013
CMOS differential and absolute thermal sensors
A Syal, V Lee, A Ivanov, J Altet
Journal of Electronic Testing 18, 295-304, 2002
Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements
E Aldrete-Vidrio, D Mateo, J Altet, MA Salhi, S Grauby, S Dilhaire, ...
Measurement Science and Technology 21 (7), 075104, 2010
Differential Temperature Sensors Fully Compatible With a 0.35-m CMOS Process
E Aldrete-Vidrio, D Mateo, J Altet
IEEE Transactions on Components and Packaging Technologies 30 (4), 618-626, 2007
MOSFET temperature sensors for on-chip thermal testing
F Reverter, J Altet
Sensors and Actuators A: Physical 203, 234-240, 2013
Efficiency determination of RF linear power amplifiers by steady-state temperature monitoring using built-in sensors
J Altet, D Gomez, X Perpinyà, D Mateo, JL González, M Vellvehi, X Jordà
Sensors and Actuators A: Physical 192, 49-57, 2013
Spatially and frequency-resolved monitoring of intradie capacitive coupling by heterodyne excitation infrared lock-in thermography
J León, X Perpiñà, J Altet, M Vellvehi, X Jordà
Applied Physics Letters 102 (5), 2013
A heterodyne method for the thermal observation of the electrical behavior of high-frequency integrated circuits
J Altet, E Aldrete-Vidrio, D Mateo, X Perpiñà, X Jordà, M Vellvehi, J Millán, ...
Measurement Science and Technology 19 (11), 115704, 2008
On-chip MOSFET temperature sensor for electrical characterization of RF circuits
F Reverter, D Gomez, J Altet
IEEE Sensors Journal 13 (9), 3343-3344, 2013
Structural RFIC device testing through built-in thermal monitoring
J Altet, A Rubio, JL Rosselló, J Segura
IEEE Communications Magazine 41 (9), 98-104, 2003
Differential sensing strategy for dynamic thermal testing of ICs
J Altet, A Rubio
Proceedings. 15th IEEE VLSI Test Symposium (Cat. No. 97TB100125), 434-439, 1997
DC temperature measurements for power gain monitoring in RF power amplifiers
J Altet, D Mateo, D Gómez, X Perpiñà, M Vellvehi, X Jordà
2012 IEEE International Test Conference, 1-8, 2012
Electro-thermal coupling analysis methodology for RF circuits
D Gómez, C Dufis, J Altet, D Mateo, JL González
Microelectronics Journal 43 (9), 633-641, 2012
Hot-spot detection in integrated circuits by substrate heat-flux sensing
X Perpiñà, J Altet, X Jorda, M Vellvehi, J Millan, N Mestres
IEEE electron device letters 29 (10), 1142-1144, 2008
On-chip thermal testing using MOSFETs in weak inversion
F Reverter, J Altet
IEEE Transactions on Instrumentation and Measurement 64 (2), 524-532, 2014
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