| Test generation with high coverages for quiescent current test of bridging faults in combinational circuits E Isern, J Figueras Proceedings of IEEE International Test Conference-(ITC), 73-82, 1993 | 64 | 1993 |
| I/sub DDQ/test and diagnosis of CMOS circuits E Isern, J Figueras IEEE Design & Test of Computers 12 (4), 60-67, 1995 | 48 | 1995 |
| Floating gate CMOS dosimeter with frequency output E Garcia-Moreno, E Isern, M Roca, R Picos, J Font, J Cesari, A Pineda IEEE Transactions on Nuclear Science 59 (2), 373-378, 2012 | 47 | 2012 |
| Oscillation-test technique for CMOS operational amplifiers by monitoring supply current J Font, J Ginard, E Isern, M Roca, J Segura, E Garcia Analog Integrated Circuits and Signal Processing 33, 213-224, 2002 | 40 | 2002 |
| Temperature compensated floating gate MOS radiation sensor with current output E Garcia-Moreno, E Isern, M Roca, R Picos, J Font, J Cesari, A Pineda IEEE Transactions on Nuclear Science 60 (5), 4026-4030, 2013 | 34 | 2013 |
| Verifying functional specifications by regression techniques on lissajous test signatures L Balado, E Lupon, J Figueras, M Roca, E Isern, R Picos IEEE Transactions on Circuits and Systems I: Regular Papers 56 (4), 754-762, 2008 | 29 | 2008 |
| Efficient parallel implementation of reservoir computing systems ML Alomar, ES Skibinsky-Gitlin, CF Frasser, V Canals, E Isern, M Roca, ... Neural Computing and Applications 32, 2299-2313, 2020 | 24 | 2020 |
| IDDQ testing: state of the art and future trends A Ferré, E Isern, J Rius, R Rodrı́guez-Montañés, J Figueras Integration 26 (1-2), 167-196, 1998 | 24 | 1998 |
| A sub-ns integrated CMOS laser driver with configurable laser pulses for time-of-flight applications G Blasco, D Dörich, H Reh, R Burkard, E Isern, E Martin IEEE Sensors Journal 18 (16), 6547-6556, 2018 | 22 | 2018 |
| Analysis of dissipation energy of switching digital CMOS gates with coupled outputs F Moll, M Roca, E Isern Microelectronics Journal 34 (9), 833-842, 2003 | 21 | 2003 |
| Application of predictive oscillation-based test to a CMOS opamp K Suenaga, E Isern, R Picos, S Bota, M Roca, E García-Moreno IEEE Transactions on Instrumentation and Measurement 59 (8), 2076-2082, 2009 | 20 | 2009 |
| Transient current testing based on current (charge) integration I De Paul, R Picos, JL Rossello, M Roca, E Isern, J Segura, CF Hawkins Proceedings 1998 IEEE International Workshop on IDDQ Testing (Cat. No …, 1998 | 18 | 1998 |
| Analysis of I/sub DDQ/detectable bridges in combinational CMOS circuits E Isern, J Figueras Proceedings of IEEE VLSI Test Symposium, 368-373, 1994 | 18 | 1994 |
| Radiation sensor compatible with standard CMOS technology EG Moreno, R Picos, E Isern, M Roca, S Bota, K Suenaga IEEE Transactions on Nuclear Science 56 (5), 2910-2915, 2009 | 17 | 2009 |
| Experimental analysis of transient current testing based on charge observation J Segura, I De Paul, M Roca, E Isern, CF Hawkins Electronics Letters 35 (6), 441-443, 1999 | 17 | 1999 |
| A BICS for CMOS opamps by monitoring the supply current peak J Font, J Ginard, E Isern, M Roca, J Segura, E Garcia Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW …, 2002 | 16 | 2002 |
| Experimental results on BIC sensors for transient current testing R Picos, M Roca, E Isern, J Segura, E García-Moreno Journal of Electronic Testing 16, 235-241, 2000 | 15 | 2000 |
| Design of a stable pulse generator system based on a Ring-VCO Phase-Locked Loop using 180nm CMOS technology G Blasco, E Isern, E Martin 2015 Conference on Design of Circuits and Integrated Systems (DCIS), 1-6, 2015 | 14 | 2015 |
| Predictive test strategy for CMOS RF mixers E Garcia-Moreno, K Suenaga, R Picos, S Bota, M Roca, E Isern Integration 42 (1), 95-102, 2009 | 13 | 2009 |
| Reservoir computing hardware for time series forecasting ES Skibinsky-Gitlin, ML Alomar, E Isern, M Roca, V Canals, JL Rossello 2018 28th international symposium on power and timing modeling, optimization …, 2018 | 11 | 2018 |
Miquel RocaUniversidad de las Islas BalearesΗ διεύθυνση ηλεκτρονικού ταχυδρομείου έχει επαληθευτεί στον τομέα uib.es
