| Micromanufacturing engineering and technology Y Qin William Andrew, 2010 | 385 | 2010 |
| LIGA and its Applications U Wallrabe, O Tabata, JG Korvink Wiley-VCH 7, 51-68, 2009 | 150 | 2009 |
| In-vivo x-ray dark-field chest radiography of a pig LB Gromann, F De Marco, K Willer, PB Noël, K Scherer, B Renger, ... Scientific reports 7 (1), 4807, 2017 | 113 | 2017 |
| Dark-field computed tomography reaches the human scale M Viermetz, N Gustschin, C Schmid, J Haeusele, M von Teuffenbach, ... Proceedings of the National Academy of Sciences 119 (8), e2118799119, 2022 | 78 | 2022 |
| Nondestructive characterization of fiber orientation in short fiber reinforced polymer composites with X-ray vector radiography F Prade, F Schaff, S Senck, P Meyer, J Mohr, J Kastner, F Pfeiffer Ndt & E International 86, 65-72, 2017 | 73 | 2017 |
| Large field-of-view tiled grating structures for X-ray phase-contrast imaging TJ Schröter, FJ Koch, P Meyer, D Kunka, J Meiser, K Willer, L Gromann, ... Review of Scientific Instruments 88 (1), 2017 | 51 | 2017 |
| Quantitative imaging using high-energy X-ray phase-contrast CT with a 70 kVp polychromatic X-ray spectrum A Sarapata, M Willner, M Walter, T Duttenhofer, K Kaiser, P Meyer, ... Optics express 23 (1), 523-535, 2015 | 51 | 2015 |
| DoseSim: Microsoft-Windows graphical user interface for using synchrotron x-ray exposure and subsequent development in the LIGA process P Meyer, J Schulz, L Hahn Review of Scientific Instruments 74 (2), 1113-1119, 2003 | 51 | 2003 |
| Intercomparative study of the detection characteristics of the CR-39 SSNTD for light ions: present status of the Besancon-Dresden approaches C Brun, M Fromm, M Jouffroy, P Meyer, JE Groetz, F Abel, A Chambaudet, ... Radiation measurements 31 (1-6), 89-98, 1999 | 51 | 1999 |
| Investigations of the development rate of irradiated PMMA microstructures in deep X-ray lithography P Meyer, A El-Kholi, J Schulz Microelectronic Engineering 63 (4), 319-328, 2002 | 46 | 2002 |
| Ion track etching in isotropic polymers: etched track shape and detection efficiency M Fromm, P Meyer, A Chambaudet Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1996 | 40 | 1996 |
| Time resolved X-ray dark-field tomography revealing water transport in a fresh cement sample F Prade, K Fischer, D Heinz, P Meyer, J Mohr, F Pfeiffer Scientific reports 6 (1), 29108, 2016 | 36 | 2016 |
| Deep x-ray lithography P Meyer, J Schulz, V Saile Micromanufacturing Engineering and Technology, 365-391, 2010 | 32 | 2010 |
| On the origin and nature of the grating interferometric dark-field contrast obtained with low-brilliance x-ray sources T Koenig, M Zuber, B Trimborn, T Farago, P Meyer, D Kunka, F Albrecht, ... Physics in Medicine & Biology 61 (9), 3427, 2016 | 31 | 2016 |
| Increasing the field of view in grating based X-ray phase contrast imaging using stitched gratings J Meiser, M Willner, T Schröter, A Hofmann, J Rieger, F Koch, ... Journal of X-ray science and technology 24 (3), 379-388, 2016 | 31 | 2016 |
| Why you will use the deep X-ray LIG (A) technology to produce MEMS? P Meyer, J Schulz, L Hahn, V Saile Microsystem Technologies 14, 1491-1497, 2008 | 29 | 2008 |
| Large-area full field x-ray differential phase-contrast imaging using 2D tiled gratings TJ Schröter, FJ Koch, D Kunka, P Meyer, S Tietze, S Engelhardt, M Zuber, ... Journal of Physics D: Applied Physics 50 (22), 225401, 2017 | 27 | 2017 |
| X-ray grating interferometry at photon energies over 180 keV M Ruiz-Yaniz, F Koch, I Zanette, A Rack, P Meyer, D Kunka, A Hipp, ... Applied Physics Letters 106 (15), 2015 | 26 | 2015 |
| Note: Gratings on low absorbing substrates for x-ray phase contrast imaging FJ Koch, TJ Schröter, D Kunka, P Meyer, J Meiser, A Faisal, MI Khalil, ... Review of Scientific Instruments 86 (12), 2015 | 24 | 2015 |
| A new method for reading CR-39 by using coherent light scattering JE Groetz, A Lacourt, P Meyer, M Fromm, A Chambaudet, J Potter Radiation protection dosimetry 85 (1-4), 447-450, 1999 | 23 | 1999 |
Franz PfeifferProfessor for Physics, Technical University of MunichVerified email at tum.de
