Dadi Gudmundsson
Dadi Gudmundsson
Unknown affiliation
Verified email at sensoranalytics.com - Homepage
Title
Cited by
Cited by
Year
Tuning robotic part feeder parameters to maximize throughput
D Gudmundsson, K Goldberg
Assembly Automation 19 (3), 216-221, 1999
311999
Tuning robotic part feeder parameters to maximize throughput
D Gudmundsson, K Goldberg
Robotics and Automation, 1997. Proceedings., 1997 IEEE International …, 1997
311997
Fabless-foundry partnership: Models and analysis of coordination issues
A Chatterjee, D Gudmundsson, RK Nurani, S Seshadri, JG Shanthikumar
IEEE transactions on semiconductor manufacturing 12 (1), 44-52, 1999
291999
Oct. 1999.“Optimized Sample Planning for Wafer Defect Inspection,” Semiconductor Manufacturing Conference Proceedings
R Williams, D Gudmundsson, K Monahan, R Nurani, M Stoller, ...
1999 IEEE International Symposium on Santa Clara, CA. Piscataway, NJ, 43-46, 0
29
Critical dimension sample planning for sub-0.25 micron processes
RC Elliott, RK Nurani, D Gudmundsson, M Preil, R Nasongkhla, ...
Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI …, 1999
241999
Optimized sample planning for wafer defect inspection
R Williams, D Gudmundsson, K Monahan, JG Shanthikumar
Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International …, 1999
241999
Challenging the paradigm of monitor reduction to achieve lower product costs
R Williams, D Gudmundsson, R Nurani, M Stoller, A Chatterjee, ...
Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI …, 1999
191999
A reticle quality management strategy in wafer fabs addressing progressive mask defect growth problem at low-k1 lithography
K Bhattacharyya, K Son, BG Eynon Jr, D Gudmundsson, C Jaehnert, ...
Photomask Technology, 89-97, 2004
162004
Optimizing robotic part feeder throughput with queueing theory
D Gudmundsson, K Goldberg
Assembly Automation 27 (2), 134-140, 2007
152007
Evaluating inspection strategies using advanced statistical methods
RK Nurani, M Stoller, D Gudmundsson, JG Shanthikumar
KLA-Tencor Yield Management Solutions 1 (3), 12-14, 1999
81999
Improving the deployment of inspection tools; tutorial on inspection capacity and sample planning
D Gudmundsson, JG Shanthikumar
Semiconductor Manufacturing, 2005. ISSM 2005, IEEE International Symposium …, 2005
72005
Inspection and metrology capacity allocation in the full production and ramp phases of semiconductor manufacturing
D Gudmundsson
Dissertation Abstracts International 68 (09), 2005
62005
Estimating and optimizing throughput of a robotic part feeder using queueing theory
D Gudmundsson, K Goldberg
Intelligent Robots and Systems, 1998. Proceedings., 1998 IEEE/RSJ …, 1998
51998
Cost effective reticle quality management strategies in wafer fabs
V Samek, B Shiffler, W Tomlinson, D Gudmundsson, J Merritt, R Nurani, ...
The 10th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference …, 1999
41999
Integrated process and inspection/metrology capacity planning
D Gudmundsson, JG Shanthikumar
Semiconductor Manufacturing, 2005. ISSM 2005, IEEE International Symposium …, 2005
32005
300mm fab automation can meet advanced defect detection needs
R Spicer, D Gudmundsson, R Nurani
Solid State Technology 44 (10), 54-62, 2001
22001
Cost effective reticle quality management strategies in wafer fabs
W Tomlinson, V Samek, B Shiffler, D Gudmundsson, J Merritt, RK Nurani, ...
Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI …, 1999
21999
Comprehensive cost-effective photo defect monitoring strategy
I Peterson, M Stoller, D Gudmundsson, R Nurani, S Ashkenaz, L Breaux
Semiconductor Manufacturing Symposium, 2001 IEEE International, 67-70, 2001
12001
Defect Sample Planning in 300 mm Fabs
D Gudmundsson, N Narayanswami, R Nurani, A Sethuraman, M Shirey
Yield Management Yield Management, 41, 2000
2000
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