Ioannis Voyiatzis
Ioannis Voyiatzis
Άγνωστη συνεργασία
Η διεύθυνση ηλεκτρονικού ταχυδρομείου έχει επαληθευτεί στον τομέα teiath.gr
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A concurrent built-in self-test architecture based on a self-testing RAM
I Voyiatzis, A Paschalis, D Gizopoulos, N Kranitis, C Halatsis
IEEE Transactions on Reliability 54 (1), 69-78, 2005
702005
A low-cost concurrent BIST scheme for increased dependability
I Voyiatzis, C Halatsis
IEEE Transactions on Dependable and Secure Computing 2 (2), 150-156, 2005
492005
An efficient built-in self test method for robust path delay fault testing
I Voyiatzis, A Paschalis, D Nikolos, C Halatsis
Journal of Electronic Testing 8 (2), 219-222, 1996
441996
Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time
I Voyiatzis, D Gizopoulos, A Paschalis
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 13 (9 …, 2005
382005
R-CBIST: An effective RAM-based input vector monitoring concurrent BIST technique
I Voyiatzis, A Paschalis, D Nikolos, C Halatsis
Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998
351998
An input vector monitoring concurrent BIST architecture based on a precomputed test set
I Voyiatzis, A Paschalis, D Gizopoulos, C Halatsis, FS Makri, ...
IEEE Transactions on Computers 57 (8), 1012-1022, 2008
342008
A concurrent BIST architecture based on monitoring square windows
I Voyiatzis, T Haniotakis, C Efstathiou, H Antonopoulou
5th International Conference on Design & Technology of Integrated Systems in …, 2010
332010
Test vector embedding into accumulator-generated sequences: A linear-time solution
I Voyiatzis
IEEE Transactions on Computers 54 (4), 476-484, 2005
332005
An accumulator-based compaction scheme for online BIST of RAMs
I Voyiatzis
IEEE transactions on very large scale integration (VLSI) systems 16 (9 …, 2008
292008
Accumulator-based BIST approach for stuck-open and delay fault testing
I Voyiatzis, A Paschalis, D Nikolos, C Halatsis
Proceedings the European Design and Test Conference. ED&TC 1995, 431-435, 1995
271995
Accumulator based 3-weight pattern generation
A Paschalis, I Voyiatzis, D Gizopoulos
IEEE transactions on very large scale integration (VLSI) systems 20 (2), 357-361, 2011
252011
Ensemble learning using fuzzy weights to improve learning style identification for adapted instructional routines
C Troussas, A Krouska, C Sgouropoulou, I Voyiatzis
Entropy 22 (7), 735, 2020
242020
Input vector monitoring concurrent BIST architecture using SRAM cells
I Voyiatzis, C Efstathiou
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 22 (7 …, 2013
232013
Accumulator-based weighted pattern generation
I Voyiatzis, D Gizopoulos, A Paschalis
11th IEEE International On-Line Testing Symposium, 215-220, 2005
232005
Recursive pseudo-exhaustive two-pattern generation
I Voyiatzis, D Gizopoulos, A Paschalis
IEEE transactions on very large scale integration (VLSI) systems 18 (1), 142-152, 2009
202009
An ALU-based BIST scheme for word-organized RAMs
I Voyiatzis
IEEE Transactions on Computers 57 (5), 577-590, 2008
202008
Algorithm for the generation of SIC pairs and its implementation in a BIST environment
I Voyiatzis, T Haniotakis, C Halatsis
IEE Proceedings-Circuits, Devices and Systems 153 (5), 427-432, 2006
202006
Design and Implementation of an E-exam System Based on the Android Platform
G Meletiou, I Voyiatzis, V Stavroulaki, C Sgouropoulou
2012 16th Panhellenic Conference on Informatics, 375-380, 2012
192012
Collaborative activities recommendation based on students’ collaborative learning styles using ANN and WSM
C Troussas, F Giannakas, C Sgouropoulou, I Voyiatzis
Interactive Learning Environments, 1-14, 2020
152020
On the modulo 2n+1 multiplication for diminished-1 operands
C Efstathiou, I Voyiatzis, N Sklavos
2008 2nd International Conference on Signals, Circuits and Systems, 1-5, 2008
152008
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