N.Konofaos - Google Scholar Citations

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Citations	1025	347
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Evangelou EAssociate Prof. of Physics, Dept of Physics, Univ. of IoanninaVerified email at uoi.gr
Stergios LogothetidisΚαθηγητής τμήμα φυσικής αριστοτέλειο πανεπιστήμιο θεσσαλονίκηςVerified email at auth.gr
Agis IliadisProfessor of Electrical and Computer Engineering, University of MarylandVerified email at umd.edu
Dimitris DavazoglouResearch DirectorVerified email at imel.demokritos.gr
Maria VasilopoulouResearcher, National Centre for Scientific Research DemokritosVerified email at imel.demokritos.gr
Giorgos PapadimitropoulosResearch Fellow at NCSR DemokritosVerified email at imel.demokritos.gr
Nikos PetrellisUniversity of Thessaly, Computer Science and Engineering DeptVerified email at teilar.gr
Panagiotis ArgitisResearch Director, National Center for Scientific Research "Demokritos", GreeceVerified email at imel.demokritos.gr
Dimitrios BalobasPhd Student, Aristotle University of ThessalonikiVerified email at csd.auth.gr
KENNOU STELLADepartment of Chemical Engineering, University of PatrasVerified email at chemeng.upatras.gr
Dimitra G. GeorgiadouSenior Research Fellow, University of SouthamptonVerified email at soton.ac.uk
Leonidas PalilisAssociate Professor, Department of Physics, University of PatrasVerified email at physics.upatras.gr
Ulf HelmerssonProfessor, Linköping UniversityVerified email at liu.se
Babis DimitriadisDepartment of Physics Aristotle University of Thessaloniki, 54124, GreeceVerified email at physics.auth.gr
Nikolaos A. StathopoulosProfessor of Electrical and Electronics Engineering, University of West AtticaVerified email at uniwa.gr
Konstantinos ProusalisVerified email at csd.auth.gr
Athanasios DimoulasVerified email at inn.demokritos.gr
Panos PatsalasAssoc. Professor of Applied Physics, Aristotle University of Thessaloniki, GreeceVerified email at cc.uoi.gr
Constantinos T. AngelisProfessor of Microelectronics & Telecommunications, University of IoanninaVerified email at uoi.gr
Mike KokkorisNational Technical University of AthensVerified email at central.ntua.gr

N.Konofaos

Aristotle University of Thessaloniki, Greece

Verified email at csd.auth.gr - Homepage

Microelectronics Nanoelectronics Semiconductor Devices Quantum Computers Circuits and Systems


Title	Cited by	Year
Electrical characterisation of SiON/n-Si structures for MOS VLSI electronics N Konofaos Microelectronics journal 35 (5), 421-425, 2004	73	2004
Reduced molybdenum oxide as an efficient electron injection layer in polymer light-emitting diodes M Vasilopoulou, LC Palilis, DG Georgiadou, P Argitis, S Kennou, ... Applied Physics Letters 98 (12), 65, 2011	53	2011
Characterisation of the Interface States between Amorphous Diamond‐Like Carbon Films and (100) Silicon N Konofaos, IP McClean, CB Thomas physica status solidi (a) 161 (1), 111-123, 1997	49	1997
Characterization of heterojunction devices constructed by amorphous diamondlike films on silicon N Konofaos, CB Thomas Journal of applied physics 81 (9), 6238-6245, 1997	49	1997
Electrical characterization of the SiON/Si interface for applications on optical and MOS devices N Konofaos, EK Evangelou Semiconductor science and technology 18 (1), 56, 2002	48	2002
Electrical properties of thin films on Si deposited by magnetron sputtering at low temperature Z Wang, V Kugler, U Helmersson, N Konofaos, EK Evangelou, S Nakao, ... Applied Physics Letters 79 (10), 1513-1515, 2001	48	2001
Dielectric properties and electronic transitions of porous and nanostructured cerium oxide films S Logothetidis, P Patsalas, EK Evangelou, N Konofaos, I Tsiaoussis, ... Materials Science and Engineering: B 109 (1-3), 69-73, 2004	42	2004
Target localization utilizing the success rate in infrared pattern recognition N Petrellis, N Konofaos, GP Alexiou IEEE Sensors Journal 6 (5), 1355-1364, 2006	39	2006
Tungsten oxides as interfacial layers for improved performance in hybrid optoelectronic devices M Vasilopoulou, LC Palilis, DG Georgiadou, P Argitis, S Kennou, I Kostis, ... Thin Solid Films 519 (17), 5748-5753, 2011	38	2011
Dielectric properties of CVD grown SiON thin films on Si for MOS microelectronic devices N Konofaos, EK Evangelou, X Aslanoglou, M Kokkoris, R Vlastou Semiconductor science and technology 19 (1), 50, 2003	36	2003
Properties of barium titanate (BaTiO3) thin films grown on silicon by rf magnetron sputtering EK Evangelou, N Konofaos, CB Thomas Philosophical Magazine B 80 (3), 395-407, 2000	31	2000
Characterisation of the BaTiO3/p-Si interface and applications EK Evangelou, N Konofaos, MR Craven, WM Cranton, CB Thomas Applied surface science 166 (1-4), 504-507, 2000	30	2000
Properties and density of states of the interface between silicon and carbon films rich in bonds S Logothetidis, E Evangelou, N Konofaos Journal of applied physics 82 (10), 5017-5020, 1997	27	1997
Amorphous diamondlike carbon‐silicon heterojunction devices formed by ion implantation N Konofaos, CB Thomas Applied physics letters 61 (23), 2805-2807, 1992	26	1992
Rare earth oxides as high-k dielectrics for Ge based MOS devices: An electrical study of Pt/Gd2O3/Ge capacitors EK Evangelou, G Mavrou, A Dimoulas, N Konofaos Solid-state electronics 51 (1), 164-169, 2007	23	2007
Gate stack dielectric degradation of rare-earth oxides grown on high mobility Ge substrates M Shahinur Rahman, EK Evangelou, N Konofaos, A Dimoulas Journal of Applied Physics 112 (9), 094501, 2012	21	2012
Electrical characterisation of SrTiO3/Si interfaces N Konofaos, EK Evangelou, Z Wang, V Kugler, U Helmersson Journal of non-crystalline solids 303 (1), 185-189, 2002	20	2002
Characteristics of SrTiO3 thin films deposited on Si by rf magnetron sputtering at various substrate temperatures Z Wang, V Kugler, U Helmersson, EK Evangelou, N Konofaos, S Nakao, ... Philosophical Magazine B 82 (8), 891-903, 2002	18	2002
On the use of fdtd and ray-tracing schemes in the nanonetwork environment K Kantelis, SA Amanatiadis, CK Liaskos, NV Kantartzis, N Konofaos, ... IEEE Communications Letters 18 (10), 1823-1826, 2014	16	2014
Highly porous tungsten oxides for electrochromic applications I Kostis, M Vasilopoulou, A Soultati, P Argitis, N Konofaos, AM Douvas, ... Microelectronic Engineering 111, 149-153, 2013	15	2013

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