Flavio Piccoli
Flavio Piccoli
Postdoctoral Fellow at University of Milano Bicocca
Verified email at campus.unimib.it - Homepage
Title
Cited by
Cited by
Year
Anomaly detection in nanofibrous materials by CNN-based self-similarity
P Napoletano, F Piccoli, R Schettini
Sensors 18 (1), 209, 2018
1162018
Ntire 2019 challenge on image enhancement: Methods and results
A Ignatov, R Timofte
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2019
202019
Ntire 2019 image dehazing challenge report
CO Ancuti, C Ancuti, R Timofte, L Van Gool, L Zhang, MH Yang
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2019
202019
High-resolution single image dehazing using encoder-decoder architecture
S Bianco, L Celona, F Piccoli, R Schettini
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2019
142019
Artistic photo filter removal using convolutional neural networks
S Bianco, C Cusano, F Piccoli, R Schettini
Journal of Electronic Imaging 27 (1), 011004, 2017
132017
Learning parametric functions for color image enhancement
S Bianco, C Cusano, F Piccoli, R Schettini
International Workshop on Computational Color Imaging, 209-220, 2019
102019
Content-preserving tone adjustment for image enhancement
S Bianco, C Cusano, F Piccoli, R Schettini
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2019
52019
A novel approach to data augmentation for pavement distress segmentation
D Mazzini, P Napoletano, F Piccoli, R Schettini
Computers in Industry 121, 103225, 2020
32020
Personalized image enhancement using neural spline color transforms
S Bianco, C Cusano, F Piccoli, R Schettini
IEEE Transactions on Image Processing 29, 6223-6236, 2020
32020
Single Image Dehazing by Predicting Atmospheric Scattering Parameters
S Bianco, L Celona, F Piccoli
London Imaging Meeting 2020 (1), 74-77, 2020
12020
NTIRE 2019 image dehazing challenge report
C Cusano, D Zhu, PN Michelini, T Zhang, H Jiang, R Li, Y Chen, MH Yang, ...
2021
Semi-supervised Anomaly Detection for Visual Quality Inspection
P Napoletano, F Piccoli, R Schettini
Expert Systems with Applications, 115275, 2021
2021
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Articles 1–12