| Human powered piezoelectric batteries to supply power to wearable electronic devices JL González, A Rubio, F Moll International journal of the Society of Materials Engineering for Resources …, 2002 | 208 | 2002 |
| Analysis and solutions for switching noise coupling in mixed-signal ICs X Aragones, JL Gonzalez, A Rubio Springer Science & Business Media, 2013 | 183 | 2013 |
| An approach to the analysis and detection of crosstalk faults in digital VLSI circuits A Rubio, N Itazaki, X Xu, K Kinoshita IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1994 | 158 | 1994 |
| Electrical model of the floating gate defect in CMOS ICs: implications on I/sub DDQ/testing VH Champac, A Rubio, J Figueras IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1994 | 123 | 1994 |
| Current vs. logic testing of gate oxide short, floating gate and bridging failures in CMOS R Rodríguez-Montañés, JA Segura, VH Champac, J Figueras, JA Rubio 1991, Proceedings. International Test Conference, 510, 1991 | 123* | 1991 |
| Dynamic surface temperature measurements in ICs J Altet, W Claeys, S Dilhaire, A Rubio Proceedings of the IEEE 94 (8), 1519-1533, 2006 | 92 | 2006 |
| Thermal coupling in integrated circuits: application to thermal testing J Altet, A Rubio, E Schaub, S Dilhaire, W Claeys IEEE Journal of Solid-State Circuits 36 (1), 81-91, 2001 | 82 | 2001 |
| Experimental comparison of substrate noise coupling using different wafer types X Aragones, A Rubio IEEE Journal of Solid-State Circuits 34 (10), 1405-1409, 1999 | 73 | 1999 |
| A prospect on the use of piezoelectric effect to supply power to wearable electronic devices JL Gonzalez, A Rubio, F Moll Fourth Int. Conf. Mater. Eng. Resources, ICMR, 202-206, 2001 | 66 | 2001 |
| Quiescent current sensor circuits in digital VLSI CMOS testing A Rubio, J Figueras, J Segura Electronics Letters 26 (15), 1204-1206, 1990 | 64 | 1990 |
| Crossbar-based memristive logic-in-memory architecture G Papandroulidakis, I Vourkas, A Abusleme, GC Sirakoulis, A Rubio IEEE transactions on nanotechnology 16 (3), 491-501, 2017 | 63 | 2017 |
| Four different approaches for the measurement of IC surface temperature: application to thermal testing J Altet, S Dilhaire, S Volz, JM Rampnoux, A Rubio, S Grauby, LDP Lopez, ... Microelectronics journal 33 (9), 689-696, 2002 | 63 | 2002 |
| A detailed analysis of GOS defects in MOS transistors: testing implications at circuit level J Segura, C De Benito, A Rubio, CF Hawkins Proceedings of 1995 IEEE International Test Conference (ITC), 544-551, 1995 | 62 | 1995 |
| Fault Modelling of Gate Oxide Short, Floating Gate and Bridging Failuers in CMOS Circuit VH Champac Proc. of European Test Conf., 143-148, 1991 | 58 | 1991 |
| An approach to crosstalk effect analysis and avoidance techniques in digital CMOS VLSI circuits R Anglada, A Rubio International Journal of Electronics 65 (1), 9-17, 1988 | 55 | 1988 |
| Noise generation and coupling mechanisms in deep-submicron ICs X Aragonès, JL González, F Moll, A Rubio IEEE Design & Test of Computers 19 (5), 27-35, 2002 | 53 | 2002 |
| Substrate coupling evaluation in BiCMOS technology JM Casalta, X Aragones, A Rubio IEEE Journal of Solid-State Circuits 32 (4), 598-603, 1997 | 51 | 1997 |
| Quiescent current analysis and experimentation of defective CMOS circuits JA Segura, VH Champac, R Rodriguez-Montanes, J Figueras, JA Rubio Journal of Electronic Testing 3, 337-348, 1992 | 50 | 1992 |
| Reliability challenges in design of memristive memories P Pouyan, E Amat, A Rubio 2014 5th European Workshop on CMOS Variability (VARI), 1-6, 2014 | 49 | 2014 |
| A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors J Segura, C De Benito, A Rubio, CF Hawkins Journal of Electronic Testing 8 (3), 229-239, 1996 | 47 | 1996 |
Esteve AmatInstitute of Microelectronics of BarcelonaVerified email at imb-cnm.csic.es
