| VLSI test principles and architectures: design for testability LT Wang, CW Wu, X Wen Elsevier, 2006 | 971 | 2006 |
| Electronic design automation: synthesis, verification, and test LT Wang, YW Chang, KTT Cheng Morgan Kaufmann, 2009 | 349 | 2009 |
| Testing for resistive opens and stuck opens JCM Li, CW Tseng, EJ McCluskey Proceedings International Test Conference 2001 (Cat. No. 01CH37260), 1049-1058, 2001 | 195 | 2001 |
| A secure test wrapper design against internal and boundary scan attacks for embedded cores GM Chiu, JCM Li IEEE Transactions on Very Large Scale Integration (VLSI) Systems 20 (1), 126-134, 2010 | 98 | 2010 |
| Survey of scan chain diagnosis Y Huang, R Guo, WT Cheng, JCM Li IEEE Design & Test of Computers 25 (3), 240-248, 2008 | 96 | 2008 |
| Diagnosis of sequence-dependent chips JCM Li, EJ McCluskey Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 187-192, 2002 | 75 | 2002 |
| ELF-Murphy data on defects and tests sets EJ McCluskey, A Al-Yamani, JCM Li, CW Tseng, E Volkerink, FF Ferhani, ... 22nd IEEE VLSI Test Symposium, 2004. Proceedings., 16-22, 2004 | 74 | 2004 |
| Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs JCM Li, EJ McCluskey IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2005 | 65 | 2005 |
| Jump scan: A DFT technique for low power testing MH Chiu, JCM Li 23rd IEEE VLSI Test Symposium (VTS'05), 277-282, 2005 | 54 | 2005 |
| Diagnosis of single stuck-at faults and multiple timing faults in scan chains JCM Li IEEE Transactions on Very Large Scale Integration (VLSI) Systems 13 (6), 708-718, 2005 | 53 | 2005 |
| Jump simulation: A technique for fast and precise scan chain fault diagnosis YL Kao, WS Chuang, JCM Li 2006 IEEE International Test Conference, 1-9, 2006 | 48 | 2006 |
| Testing for tunneling opens JCM Li, EJ McCluskey Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159), 85-94, 2000 | 43 | 2000 |
| Diagnosis of multiple hold-time and setup-time faults in scan chains JCM Li IEEE Transactions on Computers 54 (11), 1467-1472, 2005 | 42 | 2005 |
| Testing of TSV-induced small delay faults for 3-D integrated circuits CY Kuo, CJ Shih, YC Lu, JCM Li, K Chakrabarty IEEE Transactions on Very Large Scale Integration (VLSI) Systems 22 (3), 667-674, 2013 | 25 | 2013 |
| ELF35 experiment-Chip and experiment design JCM Li, JTY Chang, CW Tseng, EJ McCluskey Center for Reliable Computing, Stanford Univ., CA, CRC Tech. Rep, 1999 | 20 | 1999 |
| IDDQ data analysis using current signature JCM Li, EJ McCluskey Proceedings 1998 IEEE International Workshop on IDDQ Testing (Cat. No …, 1998 | 16 | 1998 |
| Effect of histidine on myocardial mitochondria and platelet aggregation during thrombotic cerebral ischemia in rats. SQ Li, G Zhao, J Li, W Qian Zhongguo yao li xue bao= Acta Pharmacologica Sinica 19 (5), 493-496, 1998 | 16 | 1998 |
| GPU-based N-detect transition fault ATPG KY Liao, SC Hsu, JCM Li Proceedings of the 50th Annual Design Automation Conference, 1-8, 2013 | 15 | 2013 |
| Evidence for the Direct Two-Photon Transition from to M Ablikim, MN Achasov, DJ Ambrose, FF An, Q An, ZH An, JZ Bai, ... Physical review letters 109 (17), 172002, 2012 | 15 | 2012 |
| 3D IC test scheduling using simulated annealing CY Hsu, CY Kuo, JCM Li, K Chakrabarty Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, 1-4, 2012 | 14 | 2012 |
Xiaoqing WenKyushu Institute of TechnologyVerified email at cse.kyutech.ac.jp
