| Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy C Riedel, R Arinero, P Tordjeman, M Ramonda, G Lévêque, GA Schwartz, ... Journal of Applied Physics 106 (2), 2009 | 90 | 2009 |
| Nanodielectric mapping of a model polystyrene-poly (vinyl acetate) blend by electrostatic force microscopy C Riedel, R Arinero, P Tordjeman, G Lévêque, GA Schwartz, A Alegría, ... Physical Review E 81 (1), 010801, 2010 | 66 | 2010 |
| Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy C Riedel, R Sweeney, NE Israeloff, R Arinero, GA Schwartz, A Alegría, ... Applied Physics Letters 96 (21), 2010 | 64 | 2010 |
| Vibration of the cantilever in force modulation microscopy analysis by a finite element model R Arinero, G Lévêque Review of scientific instruments 74 (1), 104-111, 2003 | 56 | 2003 |
| Imaging the mechanical properties of wood cell wall layers by atomic force modulation microscopy B Clair, R Arinero, G Lévèque, M Ramonda, B Thibaut IAWA journal 24 (3), 223-230, 2003 | 44 | 2003 |
| Towards a better understanding of wood cell wall characterisation with contact resonance atomic force microscopy O Arnould, R Arinero Composites Part A: Applied Science and Manufacturing 74, 69-76, 2015 | 42 | 2015 |
| Force gradient detection under vacuum on the basis of a double pass method L Portes, P Girard, R Arinero, M Ramonda Review of Scientific Instruments 77 (9), 2006 | 32 | 2006 |
| Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM) GA Schwartz, C Riedel, R Arinero, P Tordjeman, A Alegría, J Colmenero Ultramicroscopy 111 (8), 1366-1369, 2011 | 30 | 2011 |
| Nanoscale surface charge detection in epoxy resin materials using electrostatic force spectroscopy D El Khoury, R Arinero, JC Laurentie, J Castellon AIP Advances 6 (3), 2016 | 28 | 2016 |
| Development of ruthenium dioxide electrodes for pyroelectric devices based on lithium tantalate thin films L Nougaret, P Combette, R Arinero, J Podlecki, F Pascal-Delannoy Thin Solid Films 515 (7-8), 3971-3977, 2007 | 24 | 2007 |
| On the use of electrostatic force microscopy as a quantitative subsurface characterization technique: A numerical study C Riedel, A Alegria, GA Schwartz, R Arinero, J Colmenero, JJ Saenz Applied Physics Letters 99 (2), 2011 | 23 | 2011 |
| Characterization of dielectric nanocomposites with electrostatic force microscopy D El Khoury, V Fedorenko, J Castellon, M Bechelany, JC Laurentie, ... Scanning 2017, 2017 | 22 | 2017 |
| Near field imaging of a semiconductor laser by scanning probe microscopy without a photodetector MS Dunaevskiy, PA Alekseev, AN Baranov, AM Monakhov, R Teissier, ... Applied Physics Letters 103 (5), 2013 | 22 | 2013 |
| Nanoscale dielectric properties of insulating thin films: From single point measurements to quantitative images C Riedel, GA Schwartz, R Arinero, P Tordjeman, G Lévêque, A Alegría, ... Ultramicroscopy 110 (6), 634-638, 2010 | 22 | 2010 |
| High-energy heavy ion irradiation-induced structural modifications: A potential physical understanding of latent defects M Marinoni, AD Touboul, D Zander, C Petit, FÉÉ Wrobel, AMJF Carvalho, ... IEEE Transactions on Nuclear Science 55 (6), 2970-2974, 2008 | 21 | 2008 |
| Image processing for resonance frequency mapping in atomic force modulation microscopy R Arinéro, G Lévêque, P Girard, JY Ferrandis Review of scientific instruments 78 (2), 2007 | 21 | 2007 |
| Numerical simulations of electrostatic interactions between an atomic force microscopy tip and a dielectric sample in presence of buried nano-particles R Arinero, C Riedel, C Guasch Journal of Applied Physics 112 (11), 2012 | 20 | 2012 |
| Capacitive silicon micro-electromechanical resonator for enhanced photoacoustic spectroscopy K Chamassi, W Trzpil, R Arinero, R Rousseau, A Vicet, M Bahriz Applied Physics Letters 115 (8), 2019 | 19 | 2019 |
| Dynamic atomic force microscopy operation based on high flexure modes of the cantilever P Girard, M Ramonda, R Arinero Review of scientific instruments 77 (9), 2006 | 19 | 2006 |
| New method for electrostatic force gradient microscopy observations and Kelvin measurements under vacuum L Portes, M Ramonda, R Arinero, P Girard Ultramicroscopy 107 (10-11), 1027-1032, 2007 | 17 | 2007 |
Gustavo Ariel SchwartzCentro de Física de Materiales - CSIC - UPV/EHUVerified email at csic.es
