Dimitrios Tassis
Dimitrios Tassis
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Determination of bulk states and interface states distributions in polycrystalline silicon thin‐film transistors
CA Dimitriadis, DH Tassis, NA Economou, AJ Lowe
Journal of applied physics 74 (4), 2919-2924, 1993
671993
On the threshold voltage and channel conductance of polycrystalline silicon thin‐film transistors
CA Dimitriadis, DH Tassis
Journal of applied physics 79 (8), 4431-4437, 1996
581996
A compact drain current model of short-channel cylindrical gate-all-around MOSFETs
A Tsormpatzoglou, DH Tassis, CA Dimitriadis, G Ghibaudo, ...
Semiconductor science and technology 24 (7), 075017, 2009
522009
Compact model of drain current in short-channel triple-gate FinFETs
N Fasarakis, A Tsormpatzoglou, DH Tassis, I Pappas, K Papathanasiou, ...
IEEE transactions on electron devices 59 (7), 1891-1898, 2012
452012
Infrared spectroscopic and electronic transport properties of polycrystalline semiconducting FeSi2 thin films
DH Tassis, CL Mitsas, TT Zorba, CA Dimitriadis, O Valassiades, ...
Journal of applied physics 80 (2), 962-968, 1996
441996
Effect of localized interface charge on the threshold voltage of short-channel undoped symmetrical double-gate MOSFETs
EG Ioannidis, A Tsormpatzoglou, DH Tassis, CA Dimitriadis, G Ghibaudo, ...
IEEE transactions on Electron Devices 58 (2), 433-440, 2010
402010
Characteristics of Schottky diodes deposited by reactive magnetron sputtering
CA Dimitriadis, JI Lee, P Patsalas, S Logothetidis, DH Tassis, J Brini, ...
Journal of applied physics 85 (8), 4238-4242, 1999
381999
Characterization of traps in the gate dielectric of amorphous and nanocrystalline silicon thin-film transistors by 1/f noise
EG Ioannidis, A Tsormpatzoglou, DH Tassis, CA Dimitriadis, F Templier, ...
Journal of Applied Physics 108 (10), 106103, 2010
352010
Analytical modeling of threshold voltage and interface ideality factor of nanoscale ultrathin body and buried oxide SOI MOSFETs with back gate control
N Fasarakis, T Karatsori, DH Tassis, CG Theodorou, F Andrieu, O Faynot, ...
IEEE Transactions on Electron Devices 61 (4), 969-975, 2014
332014
Analytical modelling for the current–voltage characteristics of undoped or lightly-doped symmetric double-gate MOSFETs
A Tsormpatzoglou, DH Tassis, CA Dimitriadis, G Ghibaudo, ...
Microelectronic Engineering 87 (9), 1764-1768, 2010
332010
On-state drain current modeling of large-grain poly-Si TFTs based on carrier transport through latitudinal and longitudinal grain boundaries
AT Hatzopoulos, DH Tassis, NA Hastas, CA Dimitriadis, G Kamarinos
IEEE transactions on electron devices 52 (8), 1727-1733, 2005
332005
Analytical unified threshold voltage model of short-channel FinFETs and implementation
N Fasarakis, A Tsormpatzoglou, DH Tassis, CA Dimitriadis, ...
Solid-state electronics 64 (1), 34-41, 2011
322011
Output characteristics of short‐channel polycrystalline silicon thin‐film transistors
CA Dimitriadis, DH Tassis
Journal of applied physics 77 (5), 2177-2183, 1995
311995
The Meyer–Neldel rule in the conductivity of polycrystalline semiconducting films
DH Tassis, CA Dimitriadis, O Valassiades
Journal of applied physics 84 (5), 2960-2962, 1998
301998
An analytical hot-carrier induced degradation model in polysilicon TFTs
AT Hatzopoulos, DH Tassis, NA Hastas, CA Dimitriadis, G Kamarinos
IEEE transactions on electron devices 52 (10), 2182-2187, 2005
272005
Compact modeling of nanoscale trapezoidal FinFETs
N Fasarakis, TA Karatsori, A Tsormpatzoglou, DH Tassis, ...
IEEE Transactions on Electron Devices 61 (2), 324-332, 2013
262013
Electrical characterization of nanocrystalline carbon–silicon heterojunctions
NA Hastas, CA Dimitriadis, DH Tassis, S Logothetidis
Applied Physics Letters 79 (5), 638-640, 2001
242001
Electrical transport and low frequency noise characteristics of Au/n-GaAs Schottky diodes containing InAs quantum dots
NA Hastas, DH Tassis, CA Dimitriadis, L Dozsa, S Franchi, P Frigeri
Semiconductor science and technology 19 (3), 461, 2004
222004
Optical and electrical characterization of high quality β-FeSi2 thin films grown by solid phase epitaxy
DH Tassis, CL Mitsas, TT Zorba, M Angelakeris, CA Dimitriadis, ...
Applied surface science 102, 178-183, 1996
221996
Structural, electrical, and low-frequency-noise properties of amorphous-carbon–silicon heterojunctions
NA Hastas, CA Dimitriadis, P Patsalas, Y Panayiotatos, DH Tassis, ...
Journal of Applied Physics 89 (5), 2832-2838, 2001
202001
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