Xiaolong Bai
Cited by
Cited by
Saliency-based defect detection in industrial images by using phase spectrum
X Bai, Y Fang, W Lin, L Wang, BF Ju
IEEE Transactions on Industrial Informatics 10 (4), 2135-2145, 2014
Learning ECOC code matrix for multiclass classification with application to glaucoma diagnosis
X Bai, SI Niwas, W Lin, BF Ju, CK Kwoh, L Wang, CC Sng, MC Aquino, ...
Journal of medical systems 40 (4), 78, 2016
Automated anterior segment OCT image analysis for angle closure glaucoma mechanisms classification
SI Niwas, W Lin, X Bai, CK Kwoh, CCJ Kuo, CC Sng, MC Aquino, ...
Computer methods and programs in biomedicine 130, 65-75, 2016
Mechanism of B removal by solvent refining of silicon in Al–Si melt with Ti addition
B Ban, J Li, X Bai, Q He, J Chen, S Dai
Journal of alloys and compounds 672, 489-496, 2016
Removal of impurities from metallurgical grade silicon during Ga-Si solvent refining
J Li, B Ban, Y Li, X Bai, T Zhang, J Chen
Silicon 9 (1), 77-83, 2017
Effect of cooling rate on phosphorus removal during Al-Si solvent refining
Y Li, B Ban, J Li, T Zhang, X Bai, J Chen, S Dai
Metallurgical and materials transactions B 46 (2), 542-544, 2015
Effect of Ti addition on B removal during silicon refining in Al-30% Si alloy directional solidification
X Bai, B Ban, J Li, Z Fu, Z Peng, C Wang, J Chen
Separation and Purification Technology 174, 345-351, 2017
The mechanism of P removal by solvent refining in Al-Si-P system
B Ban, X Bai, J Li, Y Li, J Chen, S Dai
Metallurgical and Materials Transactions B 46 (6), 2430-2437, 2015
Reliable feature selection for automated angle closure glaucoma mechanism detection
SI Niwas, W Lin, X Bai, CK Kwoh, CC Sng, MC Aquino, PTK Chew
Journal of medical systems 39 (3), 1-10, 2015
Effect of kinetics on P removal by Al-Si solvent refining at low solidification temperature
B Ban, X Bai, J Li, J Chen, S Dai
Journal of Alloys and Compounds 685, 604-609, 2016
Simultaneously measuring thickness, density, velocity and attenuation of thin layers using V (z, t) data from time-resolved acoustic microscopy
J Chen, X Bai, K Yang, BF Ju
Ultrasonics 56, 505-511, 2015
A novel technique for the measurement of the acoustic properties of a thin linear-viscoelastic layer using a planar ultrasonic transducer
X Bai, Z Sun, J Chen, BF Ju
Measurement Science and Technology 24 (12), 125602, 2013
An ultrasonic methodology for determining the mechanical and geometrical properties of a thin layer using a deconvolution technique
J Chen, X Bai, K Yang, BF Ju
Ultrasonics 53 (7), 1377-1383, 2013
Solidification refining of MG-Si by Al-Si alloy under rotating electromagnetic field with varying frequencies
B Ban, T Zhang, J Li, X Bai, X Pan, J Chen, SH Tabaian
Separation and Purification Technology 202, 266-274, 2018
A new method for evaluating the degeneration of articular cartilage using pulse-echo ultrasound
A Sun, X Bai, BF Ju
Review of Scientific Instruments 86 (3), 034301, 2015
Design of optimal fast scanning trajectory for the mechanical scanner of measurement instruments
BF Ju, X Bai, J Chen, Y Ge
Scanning: The Journal of Scanning Microscopies 36 (2), 185-193, 2014
The computations of reflection coefficients of multilayer structure based on the reformulation of Thomson-Haskell method
J Chen, X Bai, K Yang, BF Ju
Ultrasonics 52 (8), 1019-1023, 2012
Angular measurement of acoustic reflection coefficients by the inversion of V(z, t) data with high frequency time-resolved acoustic microscopy
J Chen, X Bai, K Yang, BF Ju
Review of Scientific Instruments 83 (1), 014901, 2012
Determination of the multiple local properties of thin layer with high lateral resolution by scanning acoustic microscopy
X Bai, Z Sun, A Sun, J Chen, BF Ju
Review of Scientific Instruments 85 (9), 094901, 2014
Simultaneous measurement of local longitudinal and transverse wave velocities, attenuation, density, and thickness of films by using point-focus ultrasonic spectroscopy
BF Ju, X Bai, J Chen
Journal of Applied Physics 112 (8), 084910, 2012
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