| Hardware trojan detection through information flow security verification A Nahiyan, M Sadi, R Vittal, G Contreras, D Forte, M Tehranipoor 2017 IEEE International Test Conference (ITC), 1-10, 2017 | 57 | 2017 |
| A novel dual sleep approach to low leakage and area efficient VLSI design N Karmakar, MZ Sadi, MK Alam, MS Islam IEEE-RSM Proc. 2009, Kota Bahru, Malaysia, 2009 | 34 | 2009 |
| Special session: Reliability analysis for ai/ml hardware S Kundu, K Basu, M Sadi, T Titirsha, S Song, A Das, U Guin 2021 IEEE 39th VLSI Test Symposium (VTS), 1-10, 2021 | 30 | 2021 |
| Special session: on the reliability of conventional and quantum neural network hardware M Sadi, Y He, Y Li, M Alam, S Kundu, S Ghosh, J Bahrami, N Karimi 2022 IEEE 40th VLSI Test Symposium (VTS), 1-12, 2022 | 27 | 2022 |
| A robust digital sensor IP and sensor insertion flow for in-situ path timing slack monitoring in SoCs M Sadi, L Winemberg, M Tehranipoor 2015 IEEE 33rd VLSI Test Symposium (VTS), 1-6, 2015 | 24 | 2015 |
| Design of a network of digital sensor macros for extracting power supply noise profile in SoCs M Sadi, M Tehranipoor IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (5 …, 2015 | 21 | 2015 |
| Test and yield loss reduction of AI and deep learning accelerators M Sadi, U Guin IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2021 | 20 | 2021 |
| SoC speed binning using machine learning and on-chip slack sensors M Sadi, S Kannan, LR Winemberg, M Tehranipoor IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016 | 20 | 2016 |
| Design of reliable SoCs with BIST hardware and machine learning M Sadi, GK Contreras, J Chen, LR Winemberg, M Tehranipoor IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (11 …, 2017 | 18 | 2017 |
| Designing efficient and high-performance ai accelerators with customized stt-mram K Mishty, M Sadi IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29 (10 …, 2021 | 15 | 2021 |
| Temperature sensitivity forecasting of electrical load MZ Sadi, SR Deeba, RH Siddique 2010 4th International Power Engineering and Optimization Conference (PEOCO …, 2010 | 15 | 2010 |
| True random number generation using latency variations of commercial MRAM chips F Ferdaus, BMSB Talukder, M Sadi, MT Rahman 2021 22nd International Symposium on Quality Electronic Design (ISQED), 510-515, 2021 | 12 | 2021 |
| Design of a digital IP for 3D-IC die-to-die clock synchronization M Sadi, S Kannan, L England, M Tehranipoor 2017 IEEE International Symposium on Circuits and Systems (ISCAS), 1-4, 2017 | 9 | 2017 |
| BIST-RM: BIST-assisted reliability management of SoCs using on-chip clock sweeping and machine learning M Sadi, G Contreras, D Tran, J Chen, LR Winemberg, M Tehranipoor 2016 IEEE International Test Conference (ITC), 1-10, 2016 | 9 | 2016 |
| An all digital distributed sensor network based framework for continuous noise monitoring and timing failure analysis in SoCs M Sadi, Z Conroy, B Eklow, M Kamm, N Bidokhti, MM Tehranipoor 2014 IEEE 23rd Asian Test Symposium, 269-274, 2014 | 7 | 2014 |
| Speed binning using machine learning and on-chip slack sensors M Sadi, M Tehranipoor, X Wang, LR Winemberg Proceedings of the 25th edition on Great Lakes Symposium on VLSI, 155-160, 2015 | 6 | 2015 |
| Soft-HaT: Software-Based Silicon Reprogramming for Hardware Trojan Implementation MM Alam, A Nahiyan, M Sadi, D Forte, M Tehranipoor ACM Transactions on Design Automation of Electronic Systems (TODAES) 25 (4 …, 2020 | 5 | 2020 |
| TRO: an on-chip ring oscillator-Based GHZ transient IR-drop monitor X Wang, P Jiao, M Sadi, D Su, LR Winemberg, M Tehranipoor IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016 | 4 | 2016 |
| Comparative analysis of subthreshold swing models for different double gate MOSFETs MZ Sadi, N Karmakar, MK Alam, MS Islam 2008 International Conference on Electrical and Computer Engineering, 152-157, 2008 | 4 | 2008 |
| Effects of Temperature and Structural Geometries on a Skyrmion Logic Gate C Tang, L Alahmed, J Xu, M Shen, NA Jones, M Sadi, U Guin, W Zhao, ... IEEE Transactions on Electron Devices 69 (4), 1706-1712, 2021 | 3 | 2021 |
