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Assaf Mansour
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Testing analog and mixed-signal circuits with built-in hardware—A new approach
SR Das, J Zakizadeh, S Biswas, MH Assaf, AR Nayak, EM Petriu, ...
IEEE Transactions on Instrumentation and Measurement 56 (3), 840-855, 2007
752007
Sensor based home automation and security system
MH Assaf, R Mootoo, SR Das, EM Petriu, V Groza, S Biswas
2012 IEEE International Instrumentation and Measurement Technology …, 2012
642012
Fault tolerance in systems design in VLSI using data compression under constraints of failure probabilities
SR Das, CV Ramamoorthy, MH Assaf, EM Petriu, WB Jone
IEEE Transactions on Instrumentation and Measurement 50 (6), 1725-1747, 2001
482001
A novel approach to designing aliasing-free space compactors based on switching theory formulation
SR Das, MH Assaf, EM Petriu, WB Jone, K Chakrabarty
IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement …, 2001
332001
TEduChain: A blockchain-based platform for crowdfunding tertiary education
MA Rashid, K Deo, D Prasad, K Singh, S Chand, M Assaf
The Knowledge Engineering Review 35, e27, 2020
262020
TEduChain: A platform for crowdsourcing tertiary education fund using blockchain technology
MA Rashid, K Deo, D Prasad, K Singh, S Chand, M Assaf
arXiv preprint arXiv:1901.06327, 2019
252019
Parity bit signature in response data compaction and built-in self-testing of VLSI circuits with nonexhaustive test sets
SR Das, M Sudarma, MH Assaf, EM Petriu, WB Jone, K Chakrabarty, ...
IEEE Transactions on Instrumentation and Measurement 52 (5), 1363-1380, 2003
252003
Digital core output test data compression architecture based on switching theory concepts
MH Assaf
Ph. D. Dissertation, School of Information Technology and Engineering …, 2003
212003
Space compression revisited
SR Das, TF Barakat, EM Petriu, MH Assaf, K Chakrabarty
IEEE Transactions on Instrumentation and Measurement 49 (3), 690-705, 2000
212000
A compact multispectral image capture unit for deployment on drones
E Bokolonga, M Hauhana, N Rollings, D Aitchison, MH Assaf, SR Das, ...
2016 IEEE International Instrumentation and Measurement Technology …, 2016
192016
Fault simulation and response compaction in full scan circuits using HOPE
SR Das, CV Ramamoorthy, MH Assaf, EM Petriu, WB Jone, M Sahinoglu
IEEE Transactions on Instrumentation and Measurement 54 (6), 2310-2328, 2005
192005
On a new graph theory approach to designing zero-aliasing space compressors for built-in self-testing
SR Das, A Hossain, S Biswas, EM Petriu, MH Assaf, WB Jone, ...
IEEE Transactions on Instrumentation and Measurement 57 (10), 2146-2168, 2008
182008
MPEG-2 digital video watermarking technique
SN Biswas, S Nahar, SR Das, EM Petriu, MH Assaf, V Groza
2012 IEEE International Instrumentation and Measurement Technology …, 2012
172012
Design and implementation of high-performance master/slave memory controller with microcontroller bus architecture
S Ramagundam, SR Das, S Morton, SN Biswas, V Groza, MH Assaf, ...
2014 IEEE International Instrumentation and Measurement Technology …, 2014
162014
A self-reconfigurable platform for built-in self-test applications
V Groza, R Abielmona, MH Assaf, M Elbadri, M El-Kadri, A Khalaf
IEEE Transactions on Instrumentation and Measurement 56 (4), 1307-1315, 2007
162007
Aliasing-free compaction in testing cores-based system-on-chip (SOC) using compatibility of response data outputs
R Sunil, H Mansour, M Emil
Journal of Integrated Design and Process Science 8 (1), 1-17, 2004
162004
RFID for optimisation of public transportation system
MH Assaf, KM Williams
2011 Seventh International Conference on Intelligent Sensors, Sensor …, 2011
152011
Hardware and software co-design in space compaction of cores-based digital circuits
MH Assaf, SR Das, EM Petriu, L Jin, C Jin, D Biswas, V Groza, ...
Proceedings of the 21st IEEE Instrumentation and Measurement Technology …, 2004
152004
Space compaction under generalized mergeability
SR Das, EM Petriu, TF Barakat, MH Assaf, AR Nayak
IEEE Transactions on Instrumentation and Measurement 47 (5), 1283-1293, 1998
131998
Revisiting response compaction in space for full-scan circuits with nonexhaustive test sets using concept of sequence characterization
SR Das, CV Ramamoorthy, MH Assaf, EM Petriu, WB Jone, M Sahinoglu
IEEE transactions on instrumentation and measurement 54 (5), 1662-1677, 2005
122005
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