Παρακολούθηση
Peter Petrik
Peter Petrik
EK MFA, University of Debrecen
Η διεύθυνση ηλεκτρονικού ταχυδρομείου έχει επαληθευτεί στον τομέα mfa.kfki.hu - Αρχική σελίδα
Τίτλος
Παρατίθεται από
Παρατίθεται από
Έτος
Porous silicon formation by stain etching
É Vázsonyi, E Szilágyi, P Petrik, ZE Horváth, T Lohner, M Fried, ...
Thin Solid Films 388 (1-2), 295-302, 2001
1272001
Comparative study of surface roughness measured on polysilicon using spectroscopic ellipsometry and atomic force microscopy
P Petrik, LP Biró, M Fried, T Lohner, R Berger, C Schneider, J Gyulai, ...
Thin Solid Films 315 (1-2), 186-191, 1998
1111998
Characterization of different porous silicon structures by spectroscopic ellipsometry
M Fried, T Lohner, O Polgár, P Petrik, E Vazsonyi, I Barsony, JP Piel, ...
Thin Solid Films 276 (1-2), 223-227, 1996
711996
Ellipsometric study of polycrystalline silicon films prepared by low-pressure chemical vapor deposition
P Petrik, T Lohner, M Fried, LP Biró, NQ Khánh, J Gyulai, W Lehnert, ...
Journal of Applied Physics 87 (4), 1734-1742, 2000
672000
Reconstruction of sub-wavelength features and nano-positioning of gratings using coherent Fourier scatterometry
N Kumar, P Petrik, GKP Ramanandan, O El Gawhary, S Roy, SF Pereira, ...
Optics express 22 (20), 24678-24688, 2014
512014
Comparative study of polysilicon-on-oxide using spectroscopic ellipsometry, atomic force microscopy, and transmission electron microscopy
P Petrik, M Fried, T Lohner, R Berger, LP Bı́ró, C Schneider, J Gyulai, ...
Thin Solid Films 313, 259-263, 1998
441998
Ellipsometric characterization of damage profiles using an advanced optical model
P Petrik, O Polgár, M Fried, T Lohner, NQ Khánh, J Gyulai
Journal of Applied Physics 93 (4), 1987-1990, 2003
432003
Structural characterization of AlN films synthesized by pulsed laser deposition
A Szekeres, Z Fogarassy, P Petrik, E Vlaikova, A Cziraki, G Socol, ...
Applied Surface Science 257 (12), 5370-5374, 2011
422011
Characterization of sputtered and annealed niobium oxide films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction
M Serényi, T Lohner, P Petrik, Z Zolnai, ZE Horváth, NQ Khánh
Thin Solid Films 516 (22), 8096-8100, 2008
392008
High-speed imaging/mapping spectroscopic ellipsometry for in-line analysis of roll-to-roll thin-film photovoltaics
A Shan, M Fried, G Juhász, C Major, O Polgár, Á Németh, P Petrik, ...
IEEE journal of Photovoltaics 4 (1), 355-361, 2013
382013
Oxidation of SiC investigated by ellipsometry and Rutherford backscattering spectrometry
E Szilágyi, P Petrik, T Lohner, AA Koós, M Fried, G Battistig
Journal of Applied Physics 104 (1), 2008
372008
Nanocrystal characterization by ellipsometry in porous silicon using model dielectric function
P Petrik, M Fried, E Vazsonyi, P Basa, T Lohner, P Kozma, Z Makkai
Journal of Applied Physics 105 (2), 2009
342009
Comparative analysis of amorphous silicon and silicon nitride multilayer by spectroscopic ellipsometry and transmission electron microscopy
M Serényi, T Lohner, P Petrik, C Frigeri
Thin Solid Films 515 (7-8), 3559-3562, 2007
342007
Sol–gel synthesis of nanostructured indium tin oxide with controlled morphology and porosity
L Kőrösi, A Scarpellini, P Petrik, S Papp, I Dékány
Applied surface science 320, 725-731, 2014
332014
Refractive index depth profile in PMMA due to proton irradiation
I Rajta, SZ Szilasi, J Budai, Z Tóth, P Petrik, E Baradács
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2007
332007
High-quality PMMA/ZnO NWs piezoelectric coating on rigid and flexible metallic substrates
M Chelu, H Stroescu, M Anastasescu, JM Calderon-Moreno, S Preda, ...
Applied Surface Science 529, 147135, 2020
322020
Approaches to calculate the dielectric function of ZnO around the band gap
E Agocs, B Fodor, B Pollakowski, B Beckhoff, A Nutsch, M Jank, P Petrik
Thin Solid Films 571, 684-688, 2014
302014
Comparative study of ion implantation caused anomalous surface damage in silicon studied by spectroscopic ellipsometry and Rutherford backscattering spectrometry
T Lohner, M Fried, NQ Khanh, P Petrik, H Wormeester, MA El-Sherbiny
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1999
301999
Target dependent femtosecond laser plasma implantation dynamics in enabling silica for high density erbium doping
J Chandrappan, M Murray, T Kakkar, P Petrik, E Agocs, Z Zolnai, ...
Scientific Reports 5 (1), 14037, 2015
282015
Optical analysis of room temperature magnetron sputtered ITO films by reflectometry and spectroscopic ellipsometry
T Lohner, KJ Kumar, P Petrik, A Subrahmanyam, I Bársony
Journal of Materials Research 29 (14), 1528-1536, 2014
282014
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