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Co-authors
F. Richard YuCarleton University, Ottawa, ON, CanadaVerified email at carleton.ca
Min ChenProfessor, IEEE Fellow, Highly Cited Researcher, Huazhong University of Science and TechnologyVerified email at ieee.org
Haijun ZhangProfessor, University of Science and Technology BeijingVerified email at ustb.edu.cn
hong ji北京邮电大学Verified email at bupt.edu.cn
Julian ChengThe University of British ColumbiaVerified email at ubc.ca
Zhengguo ShengSenior Lecturer in University of Sussex, UKVerified email at sussex.ac.uk
Henry CB ChanDepartment of Computing, The Hong Kong Polytechnic UniversityVerified email at comp.polyu.edu.hk
Chunsheng ZhuThe University of British ColumbiaVerified email at ece.ubc.ca
Xiaofei WangProfessor - Tianjin UniversityVerified email at tju.edu.cn
Vincent WongDepartment of Electrical and Computer Engineering, University of British ColumbiaVerified email at ece.ubc.ca
Nan Zhao (赵楠)Dalian University of TechnologyVerified email at dlut.edu.cn
Xiping HuLanzhou University | Chinese Academy of SciencesVerified email at siat.ac.cn
Wei CaiAssistant Professor, The Chinese University of Hong Kong, ShenzhenVerified email at cuhk.edu.cn
Xiuhua LiAssistant Professor, School of Big Data & Software Engineering, Chongqing UniversityVerified email at cqu.edu.cn
Hasen NicanfarThe University of British ColumbiaVerified email at ece.ubc.ca
Shiwen MaoProfessor and Earle C. Williams Eminent Scholar, Fellow of the IEEE, Dept. ECE, Auburn UniversityVerified email at auburn.edu
Song GuoIEEE Fellow, Hong Kong Polytechnic UniversityVerified email at polyu.edu.hk
Panos NasiopoulosProfessor & Director, University of British ColumbiaVerified email at ece.ubc.ca
Edith C. H. NgaiAssociate Professor, Dept. of Electrical and Electronic Engineering, The University of Hong KongVerified email at eee.hku.hk
Lei Shu (舒磊)Professor, Nanjing Agricultural University, China and Lincoln Professor, University of Lincoln, UKVerified email at njau.edu.cn
Victor C. M. Leung
Shenzhen University/The University of British Columbia
Verified email at ieee.org - Homepage