Παρακολούθηση
Otto Jusko
Otto Jusko
Working Group Dimensional Standards, Department Coordinate Metrology, Physikalisch Technische
Η διεύθυνση ηλεκτρονικού ταχυδρομείου έχει επαληθευτεί στον τομέα ptb.de - Αρχική σελίδα
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Παρατίθεται από
Παρατίθεται από
Έτος
Strained-layer growth and islanding of germanium on Si (111)-(7× 7) studied with STM
U Köhler, O Jusko, G Pietsch, B Müller, M Henzler
Surface Science 248 (3), 321-331, 1991
2211991
Layer-by-layer growth of germanium on Si (100): strain-induced morphology and the influence of surfactants
U Köhler, O Jusko, B Müller, M Horn-von Hoegen, M Pook
Ultramicroscopy 42, 832-837, 1992
1321992
Final determination of the Boltzmann constant by dielectric-constant gas thermometry
C Gaiser, B Fellmuth, N Haft, A Kuhn, B Thiele-Krivoi, T Zandt, J Fischer, ...
Metrologia 54 (3), 280, 2017
722017
Design and three dimensional calibration of a measuring scanning tunneling microscope for metrological applications
O Jusko, X Zhao, H Wolff, G Wilkening
Review of scientific instruments 65 (8), 2514-2518, 1994
591994
Determination of the Boltzmann constant by dielectric-constant gas thermometry
B Fellmuth, J Fischer, C Gaiser, O Jusko, T Priruenrom, W Sabuga, ...
Metrologia 48 (5), 382, 2011
572011
Improved determination of the Boltzmann constant by dielectric-constant gas thermometry
C Gaiser, T Zandt, B Fellmuth, J Fischer, O Jusko, W Sabuga
Metrologia 50 (6), L7, 2013
382013
Novel multi-wave standards for the calibration of form measuring instruments
O Jusko, F Lüdicke
Proc. 1st EuSPEN, Bremen 2, 299-302, 1999
321999
Structure of the stepped Si/SiO2 interface after thermal oxidation: Investigations with scanning tunneling microscopy and spot‐profile analysis of low‐energy …
GJ Pietsch, U Köhler, O Jusko, M Henzler, PO Hahn
Applied physics letters 60 (11), 1321-1323, 1992
311992
Procedure and reference standard to determine the structural resolution in coordinate metrology
J Illemann, M Bartscher, O Jusko, F Härtig, U Neuschaefer-Rube, K Wendt
Measurement Science and Technology 25 (6), 064015, 2014
292014
Scanning tunnelling microscopy methods for the characterization of roughness and micro hardness measurements
G Barbato, K Carneiro, D Cuppini, J Garnaes, G Gori, G Hughes, ...
Synthesis report for research contract with the European Union under its …, 1995
241995
CCM key comparison in the pressure range 0.05 MPa to 1 MPa (gas medium, gauge mode). Phase A1: Dimensional measurements and calculation of effective area
GF Molinar, B Rebaglia, A Sacconi, JC Legras, GP Vailleau, JW Schmidt, ...
Metrologia 36 (6), 657, 1999
221999
Form measurements by optical and tactile scanning
O Jusko, M Neugebauer, H Reimann, P Drabarek, M Fleischer, ...
Fifth International Symposium on Instrumentation Science and Technology 7133 …, 2009
212009
Form and length measurements by use of a modified commercial form measurement instrument
F Lüdicke, O Jusko, H Reimann
ASPE Annual Meeting, 2000
212000
Calibration of Flick standards
R Thalmann, J Spiller, A Küng, O Jusko
Measurement Science and Technology 23 (9), 094008, 2012
172012
A novel piezo vibration platform for probe dynamic performance calibration
R Liang, O Jusko, F Lüdicke, M Neugebauer
Measurement Science and Technology 12 (9), 1509, 2001
172001
Final results of the geometrical calibration of the pressure balances to be used for the new determination of the Boltzmann constant
O Jusko, D Bastam, M Neugebauer, H Reimann, W Sabuga, T Priruenrom
Key Engineering Materials 437, 150-154, 2010
162010
A comparison of sensitivity standards in form metrology—final results of the EURAMET project 649
O Jusko, H Bosse, D Flack, B Hemming, M Pisani, R Thalmann
Measurement Science and Technology 23 (5), 054006, 2012
152012
A least squares algorithm for fitting data points to a circular arc cam
S Lin, O Jusko, F Härtig, J Seewig
Measurement 102, 170-178, 2017
142017
Results of the CIRP-form intercomparison 1996–1998
O Jusko, JG Salsbury, H Kunzmann
CIRP Annals 48 (1), 413-416, 1999
121999
Vacancy creation on the Si (111)− 7× 7 surface due to sulfur desorption studied by scanning tunneling microscopy
L Koenders, P Moriarty, G Hughes, O Jusko
Surface science 297 (3), L113-L118, 1993
121993
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