| Image driven machine learning methods for microstructure recognition A Chowdhury, E Kautz, B Yener, D Lewis Computational Materials Science 123, 176-187, 2016 | 320 | 2016 |
| Determination of the eutectic structure in the Ag-Cu-Sn system D Lewis, S Allen, M Notis, A Scotch Journal of electronic materials 31 (2), 161-167, 2002 | 109 | 2002 |
| Microstructural evolution in lead-free solder alloys: Part II. Directionally solidified Sn-Ag-Cu, Sn-Cu and Sn-Ag SL Allen, MR Notis, RR Chromik, RP Vinci, DJ Lewis, R Schaefer Journal of materials research 19 (5), 1425-1431, 2004 | 75 | 2004 |
| Phase-field models for eutectic solidification D Lewis, J Warren, W Boettinger, T Pusztai, L Gránásy JOM Journal of the Minerals, Metals and Materials Society 56 (4), 34-39, 2004 | 64 | 2004 |
| Image-driven discriminative and generative machine learning algorithms for establishing microstructure-processing relationships W Ma, E Kautz, A Baskaran, A Chowdhury, V Joshi, B Yener, D Lewis Journal of Applied Physics 128, 134901, 2020 | 55 | 2020 |
| Numerical analysis of the shapes and energies of droplets on micropatterned substrates D Chatain, D Lewis, JP Baland, WC Carter Langmuir 22 (9), 4237-4243, 2006 | 55 | 2006 |
| Adaptive characterization of microstructure dataset using a two stage machine learning approach A Baskaran, G Kane, K Biggs, R Hull, D Lewis Computational Materials Science 177, 109593, 2020 | 47 | 2020 |
| Grain growth and loss of texture during annealing of alloys, and the translation of Earth¢s inner core MI Bergman, DJ Lewis, IH Myint, L Slivka, S Karato, A Abreu Geophysical Research Letters 37 (22), 2010 | 38 | 2010 |
| Barrier coatings for interconnects; related devices, and methods of forming A Kebbede, GK Ofori-Okai, FJ Klug, MJ Alinger, DJ Lewis US Patent 8,163,434, 2012 | 35 | 2012 |
| Ionic Conductivity Method for measuring vaporized chromium species from solid oxide fuel cell interconnects M Casteel, D Lewis, P Willson, M Alinger international journal of hydrogen energy 37 (8), 6818-6829, 2012 | 32 | 2012 |
| Nanocrystalline–amorphous transitions in Al–Mo thin films: Bulk and surface evolution C Ophus, EJ Luber, M Edelen, Z Lee, LM Fischer, S Evoy, D Lewis, ... Acta Materialia 57 (14), 4296-4303, 2009 | 31 | 2009 |
| Directional solidification in a AgCuSn eutectic alloy RJ Schaefer, DJ Lewis Metallurgical and Materials Transactions A 36 (10), 2775-2783, 2005 | 27 | 2005 |
| An image-driven machine learning approach to kinetic modeling of a discontinuous precipitation reaction E Kautz, W Ma, S Jana, A Devaraj, V Joshi, B Yener, D Lewis Materials Characterization, 110379, 2020 | 26 | 2020 |
| Diffusion of 110mAg Tracer in Polycrystalline and Single‐Crystal Lead‐Containing Piezoelectric Ceramics DJ Lewis, D Gupta, MR Notis, Y Imanaka Journal of the American Ceramic Society 84 (8), 1777-1784, 2001 | 24 | 2001 |
| Regular N-hedra: A topological approach for analyzing three-dimensional textured polycrystals ME Glicksman, PR Rios, DJ Lewis Acta materialia 55 (12), 4167-4180, 2007 | 22 | 2007 |
| Adoption of Image-Driven Machine Learning for Microstructure Characterization and Materials Design: A Perspective A Baskaran, E Kautz, A Chowdhary, W Ma, B Yener, D Lewis JOM, 2021 | 18 | 2021 |
| Swelling and related mechanical and physical properties of carbon nanofiber filled mesophase pitch for use as a bipolar plate material C Calebrese, GA Eisman, DJ Lewis, LS Schadler Carbon 48 (13), 3939-3946, 2010 | 18 | 2010 |
| Stochasticity in materials structure, properties, and processing—A review R Hull, P Keblinski, D Lewis, A Maniatty, V Meunier, AA Oberai, CR Picu, ... Applied physics reviews 5 (1), 011302, 2018 | 17 | 2018 |
| Alloy for fuel cell interconnect D Lewis, M Jackson, C Hardwicke, A Tohmpson, S Ramasesha, S Hari, ... US Patent App. 11/249,852, 2007 | 17 | 2007 |
| A phase field model of electrochemical impedance spectroscopy W Gathright, M Jensen, D Lewis Journal of Materials Science 47 (4), 1677-1683, 2012 | 15 | 2012 |
Bülent YenerProfessor of Computer Science, Director of Data Science Research Center RPIVerified email at cs.rpi.edu
