Siddharth Garg
Siddharth Garg
Verified email at nyu.edu - Homepage
Title
Cited by
Cited by
Year
Badnets: Identifying vulnerabilities in the machine learning model supply chain
T Gu, B Dolan-Gavitt, S Garg
arXiv preprint arXiv:1708.06733, 2017
394*2017
The EDA challenges in the dark silicon era: Temperature, reliability, and variability perspectives
M Shafique, S Garg, J Henkel, D Marculescu
Proceedings of the 51st Annual Design Automation Conference, 1-6, 2014
1862014
Securing Computer Hardware Using 3D Integrated Circuit ({IC}) Technology and Split Manufacturing for Obfuscation
F Imeson, A Emtenan, S Garg, M Tripunitara
22nd {USENIX} Security Symposium ({USENIX} Security 13), 495-510, 2013
1732013
Fine-pruning: Defending against backdooring attacks on deep neural networks
K Liu, B Dolan-Gavitt, S Garg
International Symposium on Research in Attacks, Intrusions, and Defenses …, 2018
1432018
Integrated Circuit (IC) Decamouflaging: Reverse Engineering Camouflaged ICs within Minutes.
M El Massad, S Garg, MV Tripunitara
NDSS, 1-14, 2015
1342015
Cherry-picking: exploiting process variations in dark-silicon homogeneous chip multi-processors
B Raghunathan, Y Turakhia, S Garg, D Marculescu
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 39-44, 2013
1162013
Hades: Architectural synthesis for heterogeneous dark silicon chip multi-processors
Y Turakhia, B Raghunathan, S Garg, D Marculescu
2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC), 1-7, 2013
682013
Verifiable asics
RS Wahby, M Howald, S Garg, A Shelat, M Walfish
2016 IEEE Symposium on Security and Privacy (SP), 759-778, 2016
58*2016
Dark silicon as a challenge for hardware/software co-design: Invited special session paper
M Shafique, S Garg, T Mitra, S Parameswaran, J Henkel
Proceedings of the 2014 International Conference on Hardware/Software …, 2014
582014
Exploiting process variability in voltage/frequency control
S Herbert, S Garg, D Marculescu
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 20 (8 …, 2011
562011
Thundervolt: enabling aggressive voltage underscaling and timing error resilience for energy efficient deep learning accelerators
J Zhang, K Rangineni, Z Ghodsi, S Garg
Proceedings of the 55th Annual Design Automation Conference, 1-6, 2018
532018
Variability-aware dark silicon management in on-chip many-core systems
M Shafique, D Gnad, S Garg, J Henkel
2015 Design, Automation & Test in Europe Conference & Exhibition (DATE), 387-392, 2015
522015
3D-GCP: An analytical model for the impact of process variations on the critical path delay distribution of 3D ICs
S Garg, D Marculescu
2009 10th International Symposium on Quality Electronic Design, 147-155, 2009
502009
Learning the optimal operating point for many-core systems with extended range voltage/frequency scaling
DC Juan, S Garg, J Park, D Marculescu
2013 International Conference on Hardware/Software Codesign and System …, 2013
482013
Technology-driven limits on DVFS controllability of multiple voltage-frequency island designs: A system-level perspective
S Garg, D Marculescu, R Marculescu, U Ogras
Proceedings of the 46th Annual Design Automation Conference, 818-821, 2009
482009
Safetynets: Verifiable execution of deep neural networks on an untrusted cloud
Z Ghodsi, T Gu, S Garg
Advances in Neural Information Processing Systems, 4672-4681, 2017
452017
Reverse engineering camouflaged sequential circuits without scan access
M El Massad, S Garg, M Tripunitara
2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 33-40, 2017
402017
Shielding and securing integrated circuits with sensors
D Shahrjerdi, J Rajendran, S Garg, F Koushanfar, R Karri
2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 170-174, 2014
392014
Custom feedback control: enabling truly scalable on-chip power management for MPSoCs
S Garg, D Marculescu, R Marculescu
2010 ACM/IEEE International Symposium on Low-Power Electronics and Design …, 2010
372010
Analyzing and mitigating the impact of permanent faults on a systolic array based neural network accelerator
JJ Zhang, T Gu, K Basu, S Garg
2018 IEEE 36th VLSI Test Symposium (VTS), 1-6, 2018
362018
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Articles 1–20