| An adaptive-rate error correction scheme for NAND flash memory TH Chen, YY Hsiao, YT Hsing, CW Wu 2009 27th IEEE VLSI Test Symposium, 53-58, 2009 | 97 | 2009 |
| Non-volatile memory management method CW Wu, YY Hsiao, YT Hsing US Patent 8,307,261, 2012 | 51 | 2012 |
| Test access control apparatus and method thereof CW WU, CY Lo, YT Hsing US Patent App. 12/495,036, 2010 | 48 | 2010 |
| Probing system for integrated circuit devices CW Wu, CT Huang, YT Hsing US Patent App. 11/203,380, 2006 | 39* | 2006 |
| Probing system for integrated circuit devices CW Wu, CT Huang, YT Hsing US Patent App. 11/203,380, 2006 | 39* | 2006 |
| SOC test architecture and method for 3-D ICs CY Lo, YT Hsing, LM Denq, CW Wu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2010 | 38 | 2010 |
| The HOY tester-Can IC testing go wireless? CW Wu, C Huang, S Huang, P Huang, T Chang, Y Hsing 2006 International Symposium on VLSI Design, Automation and Test, 1-4, 2006 | 35 | 2006 |
| Hybrid BIST scheme for multiple heterogeneous embedded memories LM Denq, YT Hsing, CW Wu IEEE Design & Test of Computers 26 (2), 64-73, 2009 | 31 | 2009 |
| Probing system for integrated circuit device CW Wu, CT Huang, YT Hsing US Patent 7,675,309, 2010 | 20 | 2010 |
| Probing system for integrated circuit device CW Wu, CT Huang, YT Hsing US Patent 7,675,309, 2010 | 18 | 2010 |
| 3D-IC BISR for stacked memories using cross-die spares CC Chi, YF Chou, DM Kwai, YY Hsiao, CW Wu, YT Hsing, LM Denq, ... Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, 1-4, 2012 | 15 | 2012 |
| On Feasibility of HOYߞA Wireless Test Methodology for VLSI Chips and Wafers PK Chen, YT Hsing, CW Wu 2006 International Symposium on VLSI Design, Automation and Test, 1-4, 2006 | 14 | 2006 |
| Failure factor based yield enhancement for SRAM designs YT Hsing, CW Wang, CW Wu, CT Huang, CW Wu 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2004 | 12 | 2004 |
| RAMSES-D: DRAM fault simulator supporting weighted coupling fault YT Hsing, SG Wu, CW Wu 2007 IEEE International Workshop on Memory Technology, Design and Testing, 33-38, 2007 | 10 | 2007 |
| Testing and diagnosing embedded content addressable memories JF Li, RS Tzeng, CW Wu Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 389-394, 2002 | 10* | 2002 |
| Economic analysis of the HOY wireless test methodology YT Hsing, LM Denq, CH Chen, CW Wu IEEE Design & Test of Computers 27 (3), 20-30, 2009 | 8 | 2009 |
| Fault-pattern oriented defect diagnosis for flash memory MH Hsu, YT Hsing, JC Yeh, CW Wu 2006 IEEE International Workshop on Memory Technology, Design, and Testing …, 2006 | 7 | 2006 |
| Embedded testing module and testing method thereof LM Teng, YT Hsing US Patent App. 12/984,988, 2012 | 6 | 2012 |
| Stable performance MAC protocol for HOY wireless tester under large population TW Ko, YT Hsing, CW Wu, CT Huang 2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), 1-4, 2007 | 2 | 2007 |
| Algorithm integrating system and integrating method thereof CC Chen, LM Teng, YT Hsing US Patent 8,744,796, 2014 | 1 | 2014 |
Cheng-Wen Wu 吳誠文Department of Electrical Engineering, National Tsing Hua UniversityVerified email at ee.nthu.edu.tw
