| Total ionizing dose effects on analog performance of 65 nm bulk CMOS with enclosed-gate and standard layout M Bucher, A Nikolaou, A Papadopoulou, N Makris, L Chevas, G Borghello, ... 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS …, 2018 | 23 | 2018 |
| Modeling of high total ionizing dose (TID) effects for enclosed layout transistors in 65 nm bulk CMOS A Nikolaou, M Bucher, N Makris, A Papadopoulou, L Chevas, G Borghello, ... 2018 International Semiconductor Conference (CAS), 133-136, 2018 | 15 | 2018 |
| Investigation of scaling and temperature effects in total ionizing dose (TID) experiments in 65 nm CMOS L Chevas, A Nikolaou, M Bucher, N Makris, A Papadopoulou, A Zografos, ... 2018 25th International Conference" Mixed Design of Integrated Circuits and …, 2018 | 11 | 2018 |
| Extending a 65nm CMOS process design kit for high total ionizing dose effects A Nikolaou, M Bucher, N Makris, A Papadopoulou, L Chevas, G Borghello, ... 2018 7th International Conference on Modern Circuits and Systems …, 2018 | 8 | 2018 |
| Design of micropower operational transconductance amplifiers for high total ionizing dose effects A Papadopoulou, N Makris, L Chevas, A Nikolaou, M Bucher 2019 8th International Conference on Modern Circuits and Systems …, 2019 | 2 | 2019 |
| Forward and Reverse Operation of Enclosed-Gate MOSFETs and Sensitivity to High Total Ionizing Dose A Nikolaou, L Chevas, A Papadopoulou, N Makris, M Bucher, G Borghello, ... 2019 MIXDES-26th International Conference" Mixed Design of Integrated …, 2019 | | 2019 |
| IEEE: Extending a 65nm CMOS process design kit for high total ionizing dose effects A Nikolaou, L Chevas, TS Poikela, M Bucher, F Faccio, N Makris, ... | | 2018 |
