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Sandeep Sangameswaran
Sandeep Sangameswaran
R&D Program Manager, Royal Philips
Verified email at philips.com - Homepage
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Cited by
Year
ESD on-wafer characterization: Is TLP still the right measurement tool?
M Scholz, D Linten, S Thijs, S Sangameswaran, M Sawada, T Nakaei, ...
IEEE Transactions on Instrumentation and Measurement 58 (10), 3418-3426, 2009
322009
ESD reliability issues in microelectromechanical systems (MEMS): A case study on micromirrors
S Sangameswaran, J De Coster, D Linten, M Scholz, S Thijs, ...
EOS/ESD 2008-2008 30th Electrical Overstress/Electrostatic Dischargeá…, 2008
222008
Investigating ESD sensitivity in electrostatic SiGe MEMS
S Sangameswaran, J De Coster, D Linten, M Scholz, S Thijs, ...
Journal of Micromechanics and Microengineering 20 (5), 055005, 2010
132010
A study of breakdown mechanisms in electrostatic actuators using mechanical response under EOS-ESD stress
S Sangameswaran, J De Coster, M Scholz, D Linten, S Thijs, C Van Hoof, ...
2009 31st EOS/ESD Symposium, 1-8, 2009
102009
Behavior of RF MEMS switches under ESD stress
S Sangameswaran, J De Coster, V Cherman, P Czarnecki, D Linten, ...
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010, 1-8, 2010
92010
SiGe MEMS at processing temperatures below 250░ C
J El-Rifai, S Sedky, R Van Hoof, S Severi, D Lin, S Sangameswaran, ...
Sensors and Actuators A: Physical 188, 230-239, 2012
62012
Reliability of RF MEMS
I De Wolf, P Czarnecki, J De Coster, OV Pedreira, X Rottenberg, ...
Handbook of Mems for Wireless and Mobile Applications, 291-342, 2013
52013
Reliability test methodology for MEMS and MOEMS under electrical overstress and electrostatic discharge stress
S Sangameswaran, J De Coster, G Groeseneken, I De Wolf
Journal of Micro/Nanolithography, MEMS, and MOEMS 11 (2), 021204-021204, 2012
42012
Impact of design factors and environment on the ESD sensitivity of MEMS micromirrors
S Sangameswaran, J De Coster, G Groeseneken, I De Wolf
Microelectronics Reliability 50 (9-11), 1383-1387, 2010
42010
Robustness of electrostatic MEMS actuators against electrical overstress
J De Coster, X Rottenberg, S Sangameswaran, P Ekkels, HAC Tilmans, ...
TRANSDUCERS 2009-2009 International Solid-State Sensors, Actuators andá…, 2009
42009
Mechanical response of electrostatic actuators under ESD stress
S Sangameswaran, J De Coster, D Linten, M Scholz, S Thijs, C Van Hoof, ...
TRANSDUCERS 2009-2009 International Solid-State Sensors, Actuators andá…, 2009
32009
A SCR-based ESD protection for MEMS—Merits and challenges
S Sangameswaran, S Thijs, M Scholz, J De Coster, D Linten, ...
EOS/ESD Symposium Proceedings, 1-10, 2011
22011
Applications of laser-Doppler vibrometry during MEMS device qualification
J De Coster, S Sangameswaran, I De Wolf
Optical Measurement Techniques for Systems and Structures-OPTIMESS, 141-150, 2009
22009
ESD issues in MEMS: a case study in micromirrors
S Sangameswaran, J De Coster, D Linten, M Scholz, S Thijs, ...
Proc. 2nd Int. Electrostatic Workshop, 361-371, 2008
22008
Design and fabrication of SiGe MEMS structures with high intrinsic ESD robustness
S Sangameswaran, V Cherman, J De Coster, A Witvrouw, ...
2012 IEEE International Reliability Physics Symposium (IRPS), 3E. 4.1-3E. 4.6, 2012
12012
A Detailed Study of a Novel Wafer Separation Method for Surface Sensitive MEMS Wafers
K Malachowski, S Severi, R Van Hoof, S Sangameswaran, S Genda, ...
MRS Online Proceedings Library (OPL) 1415, mrsf11-1415-tt01-05, 2012
12012
An integrated measurement set-up to study the impact of atmosphere on ESD in MEMS
S Sangameswaran, J De Coster, V Cherman, D Linten, M Scholz, S Thijs, ...
12010
Electronic packaging challenges for emerging devices
S Sangameswaran, M De Samber
2012 International Conference on Emerging Electronics, 1-2, 2012
2012
Electrostatic Discharge (ESD) in Microelectromechanical Systems (MEMS): Sensitivity and Protection (Elektrostatische ontlading (ESD) in micro-elektromechanische systemen (MEMSá…
S Sangameswaran
2011
A silicon-controlled rectifier-based ESD protection for MEMS–Merits and challenges
S Sangameswaran, S Thijs, M Scholz, J De Coster, D Linten, ...
Proceedings 33rd Annual EOS/ESD Symposium, 2011
2011
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