| A proposed new type of arsenian pyrite: Composition, nanostructure and geological significance AP Deditius, S Utsunomiya, D Renock, RC Ewing, CV Ramana, U Becker, ... Geochimica et Cosmochimica Acta 72 (12), 2919-2933, 2008 | 368 | 2008 |
| Structural Stability and Phase Transitions in WO3 Thin Films CV Ramana, S Utsunomiya, RC Ewing, CM Julien, U Becker The Journal of Physical Chemistry B 110 (21), 10430-10435, 2006 | 327 | 2006 |
| Study of the Li-insertion/extraction process in LiFePO4/FePO4 CV Ramana, A Mauger, F Gendron, CM Julien, K Zaghib Journal of Power Sources 187 (2), 555-564, 2009 | 325 | 2009 |
| Structural characteristics, electrical conduction and dielectric properties of gadolinium substituted cobalt ferrite MT Rahman, M Vargas, CV Ramana Journal of Alloys and Compounds 617, 547-562, 2014 | 269 | 2014 |
| Spectroscopic characterization of electron-beam evaporated V2O5 thin films CV Ramana, OM Hussain, BS Naidu, PJ Reddy Thin Solid Films 305 (1-2), 219-226, 1997 | 234 | 1997 |
| XPS and Raman spectroscopic characterization of LiMn2O4 spinels CV Ramana, M Massot, CM Julien Surface and Interface Analysis: An International Journal devoted to the …, 2005 | 232 | 2005 |
| Structure, morphology, and optical properties of amorphous and nanocrystalline gallium oxide thin films SS Kumar, EJ Rubio, M Noor-A-Alam, G Martinez, S Manandhar, ... The Journal of Physical Chemistry C 117 (8), 4194-4200, 2013 | 220 | 2013 |
| Structure, morphology and optical properties of nanocrystalline yttrium oxide (Y2O3) thin films VH Mudavakkat, VV Atuchin, VN Kruchinin, A Kayani, CV Ramana Optical Materials 34 (5), 893-900, 2012 | 197 | 2012 |
| Chemical bonding, optical constants, and electrical resistivity of sputter-deposited gallium oxide thin films CV Ramana, EJ Rubio, CD Barraza, A Miranda Gallardo, S McPeak, ... Journal of Applied Physics 115 (4), 2014 | 190 | 2014 |
| Effect of Structure and Size on the Electrical Properties of Nanocrystalline WO3 Films RS Vemuri, KK Bharathi, SK Gullapalli, CV Ramana ACS applied materials & interfaces 2 (9), 2623-2628, 2010 | 190 | 2010 |
| Structural, magnetic, electrical, and magnetoelectric properties of Sm-and Ho-substituted nickel ferrites KK Bharathi, G Markandeyulu, CV Ramana The Journal of Physical Chemistry C 115 (2), 554-560, 2011 | 189 | 2011 |
| Structural transformation induced changes in the optical properties of nanocrystalline tungsten oxide thin films SK Gullapalli, RS Vemuri, CV Ramana Applied physics letters 96 (17), 2010 | 178 | 2010 |
| Dielectric, Complex Impedance, and Electrical Transport Properties of Erbium (Er3+) Ion-Substituted Nanocrystalline, Cobalt-Rich Ferrite (Co1.1Fe1.9–xErxO4) SG Kakade, YR Ma, RS Devan, YD Kolekar, CV Ramana The journal of physical Chemistry C 120 (10), 5682-5693, 2016 | 173 | 2016 |
| Growth and surface characterization of sputter-deposited molybdenum oxide thin films CV Ramana, VV Atuchin, VG Kesler, VA Kochubey, LD Pokrovsky, ... Applied surface science 253 (12), 5368-5374, 2007 | 161 | 2007 |
| Cobalt nanoparticles for biomedical applications: Facile synthesis, physiochemical characterization, cytotoxicity behavior and biocompatibility SM Ansari, RD Bhor, KR Pai, D Sen, S Mazumder, K Ghosh, YD Kolekar, ... Applied Surface Science 414, 171-187, 2017 | 159 | 2017 |
| Grain size effects on the optical characteristics of pulsed‐laser deposited vanadium oxide thin films CV Ramana, RJ Smith, OM Hussain Physica status solidi (a) 199 (1), R4-R6, 2003 | 155 | 2003 |
| Dielectric relaxations and alternating current conductivity in manganese substituted cobalt ferrite YD Kolekar, LJ Sanchez, CV Ramana Journal of Applied Physics 115 (14), 2014 | 153 | 2014 |
| Correlation between Surface Chemistry, Density, and Band Gap in Nanocrystalline WO3 Thin Films RS Vemuri, MH Engelhard, CV Ramana ACS applied materials & interfaces 4 (3), 1371-1377, 2012 | 153 | 2012 |
| Correlation between Growth Conditions, Microstructure, and Optical Properties in Pulsed-Laser-Deposited V2O5 Thin Films CV Ramana, RJ Smith, OM Hussain, CC Chusuei, CM Julien Chemistry of Materials 17 (5), 1213-1219, 2005 | 152 | 2005 |
| X-ray Photoelectron Spectroscopy Depth Profiling of La2O3/Si Thin Films Deposited by Reactive Magnetron Sputtering CV Ramana, RS Vemuri, VV Kaichev, VA Kochubey, AA Saraev, ... ACS applied materials & interfaces 3 (11), 4370-4373, 2011 | 140 | 2011 |
