C. V. Ramana
C. V. Ramana
Η διεύθυνση ηλεκτρονικού ταχυδρομείου έχει επαληθευτεί στον τομέα utep.edu
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Παρατίθεται από
Παρατίθεται από
Έτος
Study of the Li-insertion/extraction process in LiFePO4/FePO4
CV Ramana, A Mauger, F Gendron, CM Julien, K Zaghib
Journal of Power Sources 187 (2), 555-564, 2009
2712009
Structural Stability and Phase Transitions in WO3 Thin Films
CV Ramana, S Utsunomiya, RC Ewing, CM Julien, U Becker
The Journal of Physical Chemistry B 110 (21), 10430-10435, 2006
2712006
A proposed new type of arsenian pyrite: Composition, nanostructure and geological significance
AP Deditius, S Utsunomiya, D Renock, RC Ewing, CV Ramana, U Becker, ...
Geochimica et Cosmochimica Acta 72 (12), 2919-2933, 2008
2262008
Spectroscopic characterization of electron-beam evaporated V2O5 thin films
CV Ramana, OM Hussain, BS Naidu, PJ Reddy
Thin Solid Films 305 (1-2), 219-226, 1997
2061997
Structural characteristics, electrical conduction and dielectric properties of gadolinium substituted cobalt ferrite
MT Rahman, M Vargas, CV Ramana
Journal of Alloys and Compounds 617, 547-562, 2014
1942014
XPS and Raman spectroscopic characterization of LiMn2O4 spinels
CV Ramana, M Massot, CM Julien
Surface and Interface Analysis: An International Journal devoted to the …, 2005
1762005
Effect of Structure and Size on the Electrical Properties of Nanocrystalline WO3 Films
RS Vemuri, KK Bharathi, SK Gullapalli, CV Ramana
ACS applied materials & interfaces 2 (9), 2623-2628, 2010
1582010
Structural, magnetic, electrical, and magnetoelectric properties of Sm-and Ho-substituted nickel ferrites
KK Bharathi, G Markandeyulu, CV Ramana
The Journal of Physical Chemistry C 115 (2), 554-560, 2011
1452011
Growth and surface characterization of sputter-deposited molybdenum oxide thin films
CV Ramana, VV Atuchin, VG Kesler, VA Kochubey, LD Pokrovsky, ...
Applied surface science 253 (12), 5368-5374, 2007
1432007
Structure, morphology, and optical properties of amorphous and nanocrystalline gallium oxide thin films
SS Kumar, EJ Rubio, M Noor-A-Alam, G Martinez, S Manandhar, ...
The Journal of Physical Chemistry C 117 (8), 4194-4200, 2013
1342013
Structural transformation induced changes in the optical properties of nanocrystalline tungsten oxide thin films
SK Gullapalli, RS Vemuri, CV Ramana
Applied physics letters 96 (17), 171903, 2010
1302010
Structure, morphology and optical properties of nanocrystalline yttrium oxide (Y2O3) thin films
VH Mudavakkat, VV Atuchin, VN Kruchinin, A Kayani, CV Ramana
Optical Materials 34 (5), 893-900, 2012
1282012
Correlation between Growth Conditions, Microstructure, and Optical Properties in Pulsed-Laser-Deposited V2O5 Thin Films
CV Ramana, RJ Smith, OM Hussain, CC Chusuei, CM Julien
Chemistry of Materials 17 (5), 1213-1219, 2005
1272005
Chemical bonding, optical constants, and electrical resistivity of sputter-deposited gallium oxide thin films
CV Ramana, EJ Rubio, CD Barraza, A Miranda Gallardo, S McPeak, ...
Journal of Applied Physics 115 (4), 043508, 2014
1242014
Grain size effects on the optical characteristics of pulsed‐laser deposited vanadium oxide thin films
CV Ramana, RJ Smith, OM Hussain
Physica status solidi (a) 199 (1), R4-R6, 2003
1162003
Surface analysis of pulsed laser‐deposited V2O5 thin films and their lithium intercalated products studied by Raman spectroscopy
CV Ramana, RJ Smith, OM Hussain, M Massot, CM Julien
Surface and Interface Analysis: An International Journal devoted to the …, 2005
1082005
Dielectric, Complex Impedance, and Electrical Transport Properties of Erbium (Er3+) Ion-Substituted Nanocrystalline, Cobalt-Rich Ferrite (Co1.1Fe1.9–xErxO4)
SG Kakade, YR Ma, RS Devan, YD Kolekar, CV Ramana
The journal of physical Chemistry C 120 (10), 5682-5693, 2016
1072016
Dielectric relaxations and alternating current conductivity in manganese substituted cobalt ferrite
YD Kolekar, LJ Sanchez, CV Ramana
Journal of Applied Physics 115 (14), 144106, 2014
1052014
Correlation between Surface Chemistry, Density, and Band Gap in Nanocrystalline WO3 Thin Films
RS Vemuri, MH Engelhard, CV Ramana
ACS applied materials & interfaces 4 (3), 1371-1377, 2012
1022012
X-ray Photoelectron Spectroscopy Depth Profiling of La2O3/Si Thin Films Deposited by Reactive Magnetron Sputtering
CV Ramana, RS Vemuri, VV Kaichev, VA Kochubey, AA Saraev, ...
ACS applied materials & interfaces 3 (11), 4370-4373, 2011
1002011
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