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Yonghwi Kwon
Yonghwi Kwon
Senior R&D Engineer, Synopsys Inc, CA
Verified email at synopsys.com - Homepage
Title
Cited by
Cited by
Year
Transient Clock Power Estimation of Pre-CTS Netlist
Y Kwon, J Jung, I Han, Y Shin
2018 IEEE International Symposium on Circuits and Systems (ISCAS), 1-4, 2018
142018
Optical proximity correction using bidirectional recurrent neural network (BRNN)
Y Kwon, Y Song, Y Shin
Design-Process-Technology Co-optimization for Manufacturability XIII 10962 …, 2019
102019
Layout Pattern Synthesis for Lithography Optimizations
P Kareem, Y Kwon, Y Shin
IEEE Transactions on Semiconductor Manufacturing 33 (2), 283-290, 2020
82020
Pre-layout clock tree estimation and optimization using artificial neural network
S Koh, Y Kwon, Y Shin
Proceedings of the ACM/IEEE International Symposium on Low Power Electronics …, 2020
72020
Dynamic IR Drop Prediction Using Image-to-Image Translation Neural Network
Y Kwon, G Jung, D Hyun, Y Shin
2021 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2021
62021
Fast ECO Leakage Optimization Using Graph Convolutional Network
W Lee, Y Kwon, Y Shin
Proceedings of the 2020 on Great Lakes Symposium on VLSI, 187-192, 2020
62020
Optical Proximity Correction Using Bidirectional Recurrent Neural Network With Attention Mechanism
Y Kwon, Y Shin
IEEE Transactions on Semiconductor Manufacturing 34 (2), 168-176, 2021
52021
Optimization of accurate resist kernels through convolutional neural network
Y Kwon, Y Shin
Optical Microlithography XXXIV 11613, 92-99, 2021
32021
SRAF printing prediction using artificial neural network
Y Kwon, J Yang, S Kim, C Kim, Y Shin
Optical Microlithography XXXIII 11327, 74-82, 2020
32020
Fast Prediction of Dynamic IR-Drop Using Recurrent U-Net Architecture
Y Kwon, Y Shin
Proceedings of the 2022 ACM/IEEE Workshop on Machine Learning for CAD, 71-76, 2022
22022
Refragmentation through machine learning classifier for fast and accurate optical proximity correction
G Cho, Y Kwon, T Kim, Y Shin
DTCO and Computational Patterning 12052, 196-202, 2022
22022
Matrix-OPC with fast MEEF prediction using artificial neural network
Y Kwon, Y Shin
DTCO and Computational Patterning 12052, 217-224, 2022
22022
Test pattern extraction for lithography modeling under design rule revisions
G Cho, Y Kwon, P Kareem, S Kim, Y Shin
Optical Microlithography XXXIV 11613, 145-152, 2021
22021
Integrated Test Pattern Extraction and Generation for Accurate Lithography Modeling
G Cho, Y Kwon, P Kareem, Y Shin
IEEE Transactions on Semiconductor Manufacturing 35 (3), 495-503, 2022
12022
Hotspot pattern synthesis using generative network with hotspot probability model
B Choi, G Cho, Y Kwon, Y Shin
DTCO and Computational Patterning 12052, 147-154, 2022
12022
Fast prediction of process variation band through machine learning models
P Kareem, Y Kwon, G Cho, Y Shin
Optical Microlithography XXXIV 11613, 14-21, 2021
12021
Multisource Clock Tree Synthesis Through Sink Clustering and Fast Clock Latency Prediction
B Choi, Y Kwon, U Afzaal, Y Shin
2023 IEEE International Symposium on Circuits and Systems (ISCAS), 1-4, 2023
2023
Calibration of Compact Resist Model Through CNN Training
Y Kwon, Y Shin
IEEE Transactions on Semiconductor Manufacturing, 2023
2023
Clock Gating Synthesis of Netlist with Cyclic Logic Paths
Y Kwon, I Han, Y Shin
2019 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-6, 2019
2019
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Articles 1–19