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Julio Brandelero
Julio Brandelero
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Cited by
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Year
A high voltage high frequency resonant inverter for supplying DBD devices with short discharge current pulses
X Bonnin, J Brandelero, N Videau, H Piquet, T Meynard
IEEE Transactions on Power Electronics 29 (8), 4261-4269, 2013
562013
A non-intrusive method for measuring switching losses of GaN power transistors
J Brandelero, B Cougo, T Meynard, N Videau
IECON 2013-39th Annual Conference of the IEEE Industrial Electronics Society …, 2013
532013
An isolated multicell intercell transformer converter for applications with a high step-up ratio
F Forest, TA Meynard, E Labouré, B Gelis, JJ Huselstein, JC Brandelero
IEEE transactions on power electronics 28 (3), 1107-1119, 2012
462012
Selective gate driving in intelligent power modules
J Brandelero, J Ewanchuk, S Mollov
IEEE Transactions on Power Electronics 36 (1), 898-910, 2020
302020
Online junction temperature measurements for power cycling power modules with high switching frequencies
J Brandelero, J Ewanchuk, S Mollov
Power Semiconductor Devices and ICs (ISPSD), 2016 28th International …, 2016
292016
On-line virtual junction temperature measurement via DC gate current injection
J Brandelero, J Ewanchuk, S Mollov
CIPS 2018; 10th International Conference on Integrated Power Electronics …, 2018
242018
Lifetime extension of a multi-die SiC power module using selective gate driving with temperature feedforward compensation
J Ewanchuk, J Brandelero, S Mollov
2017 IEEE Energy Conversion Congress and Exposition (ECCE), 2520-2526, 2017
232017
Conception et réalisation d'un convertisseur multicellulaire DC/DC isolé pour application aéronautique
JC Brandelero
232015
5-phase interleaved buck converter with gallium nitride transistors
N Videau, T Meynard, V Bley, D Flumian, E Sarraute, G Fontes, ...
The 1st IEEE Workshop on Wide Bandgap Power Devices and Applications, 190-193, 2013
222013
Accurate switching energy estimation of parallel eGaN FETs for modern aircraft applications
B Cougo, H Schneider, J Brandelero, T Meynard
The 1st IEEE Workshop on Wide Bandgap Power Devices and Applications, 108-111, 2013
212013
Optimization of forced-air cooling system for accurate design of power converters
A Castelan, B Cougo, J Brandelero, D Flumian, T Meynard
2015 IEEE 24th International Symposium on Industrial Electronics (ISIE), 367-372, 2015
202015
Design of differential mode filters for two-level and multicell converters
T Meynard, B Cougo, J Brandelero
2013 IEEE 11th International Workshop of Electronics, Control, Measurement …, 2013
142013
Evaluation des pertes par commutation pour la conception des convertisseurs et applications des composants grand gap
J Brandelero, B Cougo, T Meynard, N Videau, O Goualard, X Bonnin, ...
Symposium de Génie Électrique 2014, 2014
122014
A gate driver based approach to improving the current density in a power module by equalizing the individual die temperatures
J Ewanchuk, J Brandelero, S Mollov
2018 IEEE Energy Conversion Congress and Exposition (ECCE), 4652-4658, 2018
92018
Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module
J Brandelero, J Ewanchuk, N Degrenne, S Mollov
Microelectronics Reliability 88, 428-432, 2018
82018
Method and device for determining junction temperature of die of semiconductor power module
J Ewanchuk, S Mollov, J Robinson, J Brandelero
US Patent 11,448,557, 2022
72022
Diagnostic device and method to establish degradation state of electrical connection in power semiconductor device
N Degrenne, JC Brandelero
US Patent 11,169,201, 2021
62021
Improving the die utilization and lifetime in a multi-die SiC power module by means of integrated per-die gate buffers
J Ewanchuk, J Brandelero, S Mollov
2017 29th International Symposium on Power Semiconductor Devices and IC's …, 2017
62017
Conception et réalisation d˘un convertisseur multicellulaire DC
JC Brandelero
DC isolé pour application aéronautique (Doctoral dissertation, École …, 2015
62015
Impact of heat treatment on the lifetime of wire-bonded power modules
J Brandelero, P Pichon, M Legros
Microelectronics Reliability 126, 114251, 2021
42021
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