Παρακολούθηση
Johannes Enslin
Johannes Enslin
Άγνωστη συνεργασία
Μη επαληθευμένη διεύθυνση ηλ. ταχυδρομείου
Τίτλος
Παρατίθεται από
Παρατίθεται από
Έτος
Defect-related degradation of AlGaN-based UV-B LEDs
D Monti, M Meneghini, C De Santi, G Meneghesso, E Zanoni, J Glaab, ...
IEEE Transactions on Electron Devices 64 (1), 200-205, 2016
762016
Degradation effects of the active region in UV-C light-emitting diodes
J Glaab, J Haefke, J Ruschel, M Brendel, J Rass, T Kolbe, A Knauer, ...
Journal of Applied Physics 123 (10), 2018
672018
High-power UV-B LEDs with long lifetime
J Rass, T Kolbe, N Lobo-Ploch, T Wernicke, F Mehnke, C Kuhn, J Enslin, ...
Gallium Nitride Materials and Devices X 9363, 182-194, 2015
622015
Gas sensing of nitrogen oxide utilizing spectrally pure deep UV LEDs
F Mehnke, M Guttmann, J Enslin, C Kuhn, C Reich, J Jordan, S Kapanke, ...
IEEE Journal of Selected Topics in Quantum Electronics 23 (2), 29-36, 2016
562016
Metamorphic Al0. 5Ga0. 5N: Si on AlN/sapphire for the growth of UVB LEDs
J Enslin, F Mehnke, A Mogilatenko, K Bellmann, M Guttmann, C Kuhn, ...
Journal of Crystal Growth 464, 185-189, 2017
492017
Recombination mechanisms and thermal droop in AlGaN-based UV-B LEDs
C De Santi, M Meneghini, D Monti, J Glaab, M Guttmann, J Rass, ...
Photonics Research 5 (2), A44-A51, 2017
452017
Correlation of sapphire off‐cut and reduction of defect density in MOVPE grown AlN
A Knauer, A Mogilatenko, S Hagedorn, J Enslin, T Wernicke, M Kneissl, ...
physica status solidi (b) 253 (5), 809-813, 2016
452016
Displacement Talbot lithography for nano-engineering of III-nitride materials
PM Coulon, B Damilano, B Alloing, P Chausse, S Walde, J Enslin, ...
Microsystems & Nanoengineering 5 (1), 52, 2019
442019
High-current stress of UV-B (In) AlGaN-based LEDs: Defect-generation and diffusion processes
D Monti, C De Santi, S Da Ruos, F Piva, J Glaab, J Rass, S Einfeldt, ...
IEEE Transactions on Electron Devices 66 (8), 3387-3392, 2019
332019
Localization of current-induced degradation effects in (InAlGa) N-based UV-B LEDs
J Ruschel, J Glaab, M Brendel, J Rass, C Stölmacker, N Lobo-Ploch, ...
Journal of Applied Physics 124 (8), 2018
312018
Effect of the GaN: Mg Contact Layer on the Light‐Output and Current‐Voltage Characteristic of UVB LEDs
N Susilo, J Enslin, L Sulmoni, M Guttmann, U Zeimer, T Wernicke, ...
physica status solidi (a) 215 (10), 1700643, 2018
292018
A 310 nm optically pumped AlGaN vertical-cavity surface-emitting laser
F Hjort, J Enslin, M Cobet, MA Bergmann, J Gustavsson, T Kolbe, ...
ACS photonics 8 (1), 135-141, 2020
242020
Electrochemical etching of AlGaN for the realization of thin-film devices
MA Bergmann, J Enslin, R Yapparov, F Hjort, B Wickman, ...
Applied Physics Letters 115 (18), 2019
242019
V-pit to truncated pyramid transition in AlGaN-based heterostructures
A Mogilatenko, J Enslin, A Knauer, F Mehnke, K Bellmann, T Wernicke, ...
Semiconductor Science and Technology 30 (11), 114010, 2015
232015
Influence of waveguide strain and surface morphology on AlGaN-based deep UV laser characteristics
C Kuhn, M Martens, F Mehnke, J Enslin, P Schneider, C Reich, F Krueger, ...
Journal of Physics D: Applied Physics 51 (41), 415101, 2018
212018
Highly reflective p-contacts made of Pd-Al on deep ultraviolet light-emitting diodes
HK Cho, I Ostermay, U Zeimer, J Enslin, T Wernicke, S Einfeldt, M Weyers, ...
IEEE Photonics Technology Letters 29 (24), 2222-2225, 2017
212017
Thin-film flip-chip UVB LEDs realized by electrochemical etching
MA Bergmann, J Enslin, F Hjort, T Wernicke, M Kneissl, Å Haglund
Applied Physics Letters 116 (12), 2020
162020
Analysis of doping concentration and composition in wide bandgap AlGaN: Si by wavelength dispersive x-ray spectroscopy
G Kusch, F Mehnke, J Enslin, PR Edwards, T Wernicke, M Kneissl, ...
Semiconductor Science and Technology 32 (3), 035020, 2017
162017
Electrical properties of (11-22) Si: AlGaN layers at high Al contents grown by metal-organic vapor phase epitaxy
HM Foronda, DA Hunter, M Pietsch, L Sulmoni, A Muhin, S Graupeter, ...
Applied Physics Letters 117 (22), 2020
142020
Determination of Sapphire Off‐Cut and Its Influence on the Morphology and Local Defect Distribution in Epitaxially Laterally Overgrown AlN for Optically Pumped UVC Lasers
J Enslin, A Knauer, A Mogilatenko, F Mehnke, M Martens, C Kuhn, ...
physica status solidi (a) 216 (24), 1900682, 2019
132019
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