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Co-authors
Kaibin HuangAssociate Professor, Dept. of EEE, The University of Hong Kong; IEEE FellowVerified email at eee.hku.hk
Caijun ZhongZhejiang UniversityVerified email at zju.edu.cn
Zhaoyang ZhangZhejiang UniversityVerified email at zju.edu.cn
Jun ZhangAssistant Professor, The Hong Kong Polytechnic UniversityVerified email at polyu.edu.hk
Chau YuenIEEE Fellow, Singapore University of Technology and DesignVerified email at sutd.edu.sg
Jie XuThe Chinese University of Hong Kong, ShenzhenVerified email at cuhk.edu.cn
Theodoros TsiftsisJinan University, China; University of Thessaly, GreeceVerified email at uth.gr
George K. KaragiannidisAristotle University of Thessaloniki, GreeceVerified email at auth.gr
Changsheng YouNational University of SingaporeVerified email at nus.edu.sg
Vincent LAUChair Professor, HKUSTVerified email at ee.ust.hk
Bin XiaShanghai Jiao Tong UniveristyVerified email at sjtu.edu.cn
Seung-Woo KoAssistant Professor, Korea Maritime and Ocean UniversityVerified email at kmou.ac.kr
Yin Rui(殷锐)Information Science and Electrical Engineering, Zhejiang University City CollegeVerified email at zju.edu.cn
Deniz GunduzProfessor, Imperial College LondonVerified email at imperial.ac.uk
Jiayao Zhang 张家耀University of PennsylvaniaVerified email at sas.upenn.edu
Robert HeathDistinguished Professor, North Carolina State UniversityVerified email at ncsu.edu
Kaiming ShenThe Chinese University of Hong Kong, ShenzhenVerified email at cuhk.edu.cn
Shuguang CuiChair Professor, School of Science and Engineering, CUHKSZVerified email at cuhk.edu.cn
Wei YuUniversity of TorontoVerified email at comm.utoronto.ca