nikos mavredakis
nikos mavredakis
Η διεύθυνση ηλεκτρονικού ταχυδρομείου έχει επαληθευτεί στον τομέα isc.tuc.gr
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Παρατίθεται από
Παρατίθεται από
Έτος
CMOS small-signal and thermal noise modeling at high frequencies
A Antonopoulos, M Bucher, K Papathanasiou, N Mavredakis, N Makris, ...
IEEE transactions on electron devices 60 (11), 3726-3733, 2013
342013
Measurement and modelling of 1/f noise in 180 nm NMOS and PMOS devices
N Mavredakis, A Antonopoulos, M Bucher
Proceedings of Papers 5th European Conference on Circuits and Systems for …, 2010
182010
Analog/RF figures of merit of advanced DG MOSFETs
RK Sharma, A Antonopoulos, N Mavredakis, M Bucher
2012 8th International Caribbean Conference on Devices, Circuits and Systems …, 2012
82012
Bias dependence of low frequency noise in 90nm CMOS
N Mavredakis, A Antonopoulos, M Bucher
Proc. NSTI-Nanotech/Microtech 2, 805-808, 2010
82010
Charge-Based Compact Model for Bias-Dependent Variability of 1/ Noise in MOSFETs
N Mavredakis, N Makris, P Habas, M Bucher
IEEE Transactions on Electron Devices 63 (11), 4201-4208, 2016
72016
Variability of low frequency noise and mismatch in enclosed-gate and standard nMOSFETs
M Bucher, A Nikolaou, N Mavredakis, N Makris, M Coustans, J Lolivier, ...
2017 International Conference of Microelectronic Test Structures (ICMTS), 1-4, 2017
62017
Understanding the Bias Dependence of Low Frequency Noise in Single Layer Graphene FETs
N Mavredakis, R Garcia Cortadella, A Bonaccini Calia, JA Garrido, ...
Nanoscale, 14947-14956, 2018
52018
Variability of low frequency noise in moderately-sized MOSFETs—A model for the area-and gate voltage-dependence
N Mavredakis, P Habas, A Acovic, R Meyer, M Bucher
2015 International Conference on Noise and Fluctuations (ICNF), 1-4, 2015
52015
Measurement and Compact Modeling of 1/f Noise in HV-MOSFETs
ES Nikolaos Mavredakis, Matthias Bucher, Roland
Electron Devices, IEEE Transactions on 60 (2), 2013
5*2013
Inversion-Coefficient Based Design of RF CMOS Low-Noise Amplifiers
N Mavredakis, M Bucher
2006 13th IEEE International Conference on Electronics, Circuits and Systems …, 2006
52006
Compact Model for Variability of Low Frequency Noise due to Number Fluctuation Effect
N Mavredakis, M Bucher
European Solid State Device Research Conference (ESSDERC), 464-467, 2016
42016
System level analysis of a direct-conversion WiMAX receiver at 5.3 GHz and corresponding mixer design
A Antonopoulos, N Mavredakis, N Makris, M Bucher
2008 15th International Conference on Mixed Design of Integrated Circuits …, 2008
42008
Simple 1/f noise parameter extraction method for high-voltage MOSFETs
K Fellas, N Mavredakis, W Pflanzl, E Seebacher, M Bucher
2014 29th International Conference on Microelectronics Proceedings-MIEL 2014 …, 2014
32014
Velocity Saturation Effect on Low Frequency Noise in Short Channel Single Layer Graphene Field Effect Transistors
N Mavredakis, W Wei, E Pallecchi, D Vignaud, H Happy, ...
ACS Applied Electronic Materials 1 (12), 2626-2636, 2019
22019
Statistical compact modeling of Low Frequency Noise in Buried-Channel, Native, and standard MOSFETs
N Mavredakis, M Bucher, P Habas, A Acovic, R Meyer
2017 International Conference on Noise and Fluctuations (ICNF), 1-4, 2017
22017
Modeling of high‐frequency noise of silicon CMOS transistors for RFIC design
A Antonopoulos, M Bucher, K Papathanasiou, N Makris, N Mavredakis, ...
International Journal of Numerical Modelling: Electronic Networks, Devices …, 2014
22014
Impact of design engineering on RF linearity and noise performance of nanoscale DG SOI MOSFETs
RK Sharma, A Antonopoulos, N Mavredakis, M Bucher
2013 14th International Conference on Ultimate Integration on Silicon (ULIS …, 2013
22013
Improved metal-graphene contacts for low-noise, high-density microtransistor arrays for neural sensing
N Schaefer, R Garcia-Cortadella, A Bonaccini Calia, N Mavredakis, X Illa, ...
Carbon, 2020
12020
Methodology for 1/f noise parameter extraction for high-voltage MOSFETs
N Mavredakis, W Pflanzl, E Seebacher, M Bucher
Solid-State Electronics 103, 202-208, 2015
12015
High Voltage MOSFET Compact Modeling
E Seebacher, B Senapati, K Molnar, W Pflanzl, W Posch, A Steinmair, ...
NSTI-Nanotech 2011 2, 2011
12011
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