Παρακολούθηση
Loukas Michalas
Loukas Michalas
IESL - FORTH
Η διεύθυνση ηλεκτρονικού ταχυδρομείου έχει επαληθευτεί στον τομέα physics.uoc.gr
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Παρατίθεται από
Παρατίθεται από
Έτος
A study of field emission process in electrostatically actuated MEMS switches
L Michalas, A Garg, A Venkattraman, M Koutsoureli, A Alexeenko, ...
Microelectronics Reliability 52 (9-10), 2267-2271, 2012
322012
Conduction mechanisms at distinct resistive levels of Pt/TiO2-x/Pt memristors
L Michalas, S Stathopoulos, A Khiat, T Prodromakis
Applied Physics Letters 113 (14), 143503, 2018
282018
Investigation of silicon nitride charging
M Koutsoureli, E Papandreou, L Michalas, G Papaioannou
Microelectronic Engineering 90, 145-148, 2012
262012
Electrical characteristics of interfacial barriers at metal—TiO2 contacts
L Michalas, A Khiat, S Stathopoulos, T Prodromakis
Journal of Physics D: Applied Physics 51 (42), 425101, 2018
212018
Probing contactless injection dielectric charging in RF MEMS capacitive switches
L Michalas, M Koutsoureli, G Papaioannou
Electronics letters 50 (10), 766-768, 2014
212014
A study of deposition conditions on charging properties of PECVD silicon nitride films for MEMS capacitive switches
M Koutsoureli, L Michalas, A Gantis, G Papaioannou
Microelectronics Reliability 54 (9-10), 2159-2163, 2014
202014
Charge collection mechanism in MEMS capacitive switches
M Koutsoureli, L Michalas, G Papaioannou
2012 IEEE international reliability physics symposium (IRPS), ME. 2.1-ME. 2.5, 2012
192012
The effect of temperature on dielectric charging of capacitive MEMS
M Koutsoureli, L Michalas, G Papaioannou
2011 International Reliability Physics Symposium, 3D. 4.1-3D. 4.7, 2011
182011
Effect of silicon thickness on the degradation mechanisms of sequential laterally solidified polycrystalline silicon TFTs during hot-carrier stress
AT Voutsas, DN Kouvatsos, L Michalas, GJ Papaioannou
IEEE electron device letters 26 (3), 181-184, 2005
182005
An electrical characterisation methodology for benchmarking memristive device technologies
S Stathopoulos, L Michalas, A Khiat, A Serb, T Prodromakis
Scientific reports 9 (1), 1-10, 2019
162019
An in depth analysis of pull-up capacitance-voltage characteristic for dielectric charging assessment of MEMS capacitive switches
M Koutsoureli, D Birmpiliotis, L Michalas, G Papaioannou
Microelectronics Reliability 64, 688-692, 2016
152016
Properties of contactless and contacted charging in MEMS capacitive switches
M Koutsoureli, L Michalas, P Martins, E Papandreou, A Leuliet, ...
Microelectronics Reliability 53 (9-11), 1655-1658, 2013
142013
Temperature effects on the bulk discharge current of dielectric films of MEMS capacitive switches
M Koutsoureli, L Michalas, G Papaioannou
Microelectronics Reliability 52 (9-10), 2240-2244, 2012
142012
Interface Asymmetry Induced by Symmetric Electrodes on Metal–Al:TiO–Metal Structures
L Michalas, M Trapatseli, S Stathopoulos, S Cortese, A Khiat, ...
IEEE Transactions on Nanotechnology 17 (5), 867-872, 2017
132017
Electrical assessment of diamond MIM capacitors and modeling of MEMS capacitive switch discharging
L Michalas, M Koutsoureli, S Saada, C Mer–Calfati, A Leuliet, P Martins, ...
Journal of Micromechanics and Microengineering 24 (11), 115017, 2014
112014
Temperature dependence of the conduction mechanisms through a Pb (Zr, Ti) O3 thin film
C Jégou, L Michalas, T Maroutian, G Agnus, M Koutsoureli, ...
Thin Solid Films 563, 32-35, 2014
112014
Dielectric charging effects in floating electrode MEMS capacitive switches
L Michalas, M Koutsoureli, E Papandreou, F Giacomozzi, G Papaioannou
Microelectronics Reliability 55 (9-10), 1891-1895, 2015
102015
A MIM capacitor study of dielectric charging for RF MEMS capacitive switches
L Michalas, M Koutsoureli, E Papandreou, A Gantis, G Papaioannou
Facta universitatis-series: Electronics and Energetics 28 (1), 113-122, 2015
102015
Electrical characterization of undoped diamond films for RF MEMS application
L Michalas, M Koutsoureli, E Papandreou, G Papaioannou, S Saada, ...
2013 IEEE International Reliability Physics Symposium (IRPS), 6B. 3.1-6B. 3.7, 2013
102013
Metal oxide-enabled reconfigurable memristive threshold logic gates
G Papandroulidakis, A Khiat, A Serb, S Stathopoulos, L Michalas, ...
2018 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2018
92018
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