Παρακολούθηση
Kenneth Järrendahl
Kenneth Järrendahl
Η διεύθυνση ηλεκτρονικού ταχυδρομείου έχει επαληθευτεί στον τομέα ifm.liu.se - Αρχική σελίδα
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Παρατίθεται από
Παρατίθεται από
Έτος
A spectroscopic ellipsometry study of cerium dioxide thin films grown on sapphire by rf magnetron sputtering
S Guo, H Arwin, SN Jacobsen, K Järrendahl, U Helmersson
Journal of Applied physics 77 (10), 5369-5376, 1995
2251995
Electronic structure of ScN determined using optical spectroscopy, photoemission, and ab initio calculations
D Gall, M Städele, K Järrendahl, I Petrov, P Desjardins, RT Haasch, ...
Physical Review B 63 (12), 125119, 2001
1752001
Chirality-induced polarization effects in the cuticle of scarab beetles: 100 years after Michelson
H Arwin, R Magnusson, J Landin, K Järrendahl
Philosophical Magazine 92 (12), 1583-1599, 2012
972012
Growth of epitaxial AlN (0001) on Si (111) by reactive magnetron sputter deposition
I Ivanov, L Hultman, K Järrendahl, P Mårtensson, JE Sundgren, ...
Journal of applied physics 78 (9), 5721-5726, 1995
871995
Multiple sample analysis of spectroscopic ellipsometry data of semi-transparent films
K Järrendahl, H Arwin
Thin Solid Films 313, 114-118, 1998
811998
Optical constants and Drude analysis of sputtered zirconium nitride films
M Veszelei, K Andersson, CG Ribbing, K Järrendahl, H Arwin
Applied optics 33 (10), 1993-2001, 1994
791994
Optical characterization of industrially sputtered nickel–nickel oxide solar selective surface
M Adsten, R Joerger, K Järrendahl, E Wäckelgård
Solar Energy 68 (4), 325-328, 2000
752000
Ion implanted dopants in GaN and AlN: Lattice sites, annealing behavior, and defect recovery
C Ronning, M Dalmer, M Uhrmacher, M Restle, U Vetter, L Ziegeler, ...
Journal of applied Physics 87 (5), 2149-2157, 2000
742000
Electrical and optical properties of films deposited by reactive magnetron sputtering
E Broitman, N Hellgren, K Järrendahl, MP Johansson, S Olafsson, ...
Journal of applied physics 89 (2), 1184-1190, 2001
712001
Cuticle structure of the scarab beetle Cetonia aurata analyzed by regression analysis of Mueller-matrix ellipsometric data
H Arwin, T Berlind, B Johs, K Järrendahl
Optics Express 21 (19), 22645-22656, 2013
592013
Polarizing properties and structural characteristics of the cuticle of the scarab beetle Chrysina gloriosa
LF del Río, H Arwin, K Järrendahl
Thin Solid Films 571, 410-415, 2014
472014
Mueller matrix spectroscopic ellipsometry study of chiral nanocrystalline cellulose films
A Mendoza-Galván, E Muñoz-Pineda, SJL Ribeiro, MV Santos, ...
Journal of Optics 20 (2), 024001, 2018
452018
Optical response of supported gold nanodisks
A Mendoza-Galván, K Järrendahl, A Dmitriev, T Pakizeh, M Käll, H Arwin
Optics Express 19 (13), 12093-12107, 2011
412011
Electrical and optical properties of sputter deposited tin doped indium oxide thin films with silver additive
A Hultåker, K Järrendahl, J Lu, CG Granqvist, GA Niklasson
Thin solid films 392 (2), 305-310, 2001
382001
Materials properties and characterization of SiC
K Järrendahl, RF Davis
Semiconductors and Semimetals 52, 1-20, 1998
381998
Enhanced quality of epitaxial AlN thin films on 6H–SiC by ultra-high-vacuum ion-assisted reactive dc magnetron sputter deposition
S Tungasmita, J Birch, POÅ Persson, K Järrendahl, L Hultman
Applied Physics Letters 76 (2), 170-172, 2000
362000
Optical properties of 4H–SiC
R Ahuja, A Ferreira da Silva, C Persson, JM Osorio-Guillen, I Pepe, ...
Journal of applied physics 91 (4), 2099-2103, 2002
352002
Ordinary and extraordinary dielectric functions of 4H–and 6H–SiC from 3.5 to 9.0 eV
OPA Lindquist, K Järrendahl, S Peters, JT Zettler, C Cobet, N Esser, ...
Applied Physics Letters 78 (18), 2715-2717, 2001
342001
Compositional information from amorphous Si-Ge multilayers using high-resolution electron microscopy imaging and direct digital recording
P Henning, LR Wallenberg, K Järrendahl, L Hultman, LKL Falk, ...
Ultramicroscopy 66 (3-4), 221-235, 1996
321996
Linear birefringent films of cellulose nanocrystals produced by dip-coating
A Mendoza-Galván, T Tejeda-Galán, AB Domínguez-Gómez, ...
Nanomaterials 9 (1), 45, 2018
292018
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