Roger H. French
Roger H. French
Kyocera Professor, Case Western Reserve University, Case School of Engineering, Materials Science
Verified email at - Homepage
Cited by
Cited by
Bulk electronic structure of Experiment and theory
K Van Benthem, C Elsässer, RH French
Journal of applied physics 90 (12), 6156-6164, 2001
Electronic Band Structure of Al2O3, with Comparison to Alon and AIN
RH French
Journal of the American Ceramic Society 73 (3), 477-489, 1990
Experimental and theoretical determination of the electronic structure and optical properties of three phases of ZrO\textsubscript{2}
RH French, SJ Glass, FS Ohuchi, YN Xu, WY Ching
Physical Review B 49 (8), 5133, 1994
Vibrational spectroscopy of aluminum nitride
LE McNeil, M Grimsditch, RH French
Journal of the American Ceramic Society 76 (5), 1132-1136, 1993
Long range interactions in nanoscale science
RH French, VA Parsegian, R Podgornik, RF Rajter, A Jagota, J Luo, ...
Reviews of Modern Physics 82 (2), 1887, 2010
Origins and applications of London dispersion forces and Hamaker constants in ceramics
RH French
Journal of the American Ceramic Society 83 (9), 2117-2146, 2000
Comparisons of Hamaker constants for ceramic systems with intervening vacuum or water: From force laws and physical properties
HD Ackler, RH French, YM Chiang
Journal of colloid and interface science 179 (2), 460-469, 1996
Optical properties of aluminum oxide: determined from vacuum ultraviolet and electron energy‐loss spectroscopies
RH French, H Müllejans, DJ Jones
Journal of the American Ceramic Society 81 (10), 2549-2557, 1998
Parametric tip model and force–distance relation for Hamaker constant determination from atomic force microscopy
C Argento, RH French
Journal of Applied Physics 80 (11), 6081-6090, 1996
Method for providing nano-structures of uniform length
RH French, T Gierke, MA Harmer, A Jagota, SR Lustig, RH Mehta, ...
US Patent 6,998,358, 2006
Optical properties of Teflon® AF amorphous fluoropolymers
MK Yang, RH French, EW Tokarsky
Journal of Micro/Nanolithography, MEMS and MOEMS 7 (3), 033010-033010-9, 2008
Method For Providing Nano-structures Of Uniform Length
R French, T Gierke, M Harmer, P Hietpas, A Jagota, S Lustig, R Mehta, ...
WO Patent 2,003,086,961, 2003
Thin glass film between ultrafine conductor particles in thick‐film resistors
YM Chiang, LA Silverman, RH French, RM Cannon
Journal of the American Ceramic Society 77 (5), 1143-1152, 1994
Temperature dependence of the electronic structure of oxides: MgO, MgAl\textsubscript{2}O\textsubscript{4} and Al\textsubscript{2}O\textsubscript{3}
ML Bortz, RH French, DJ Jones, RV Kasowski, FS Ohuchi
Physica Scripta 41 (4), 537, 1990
Electronic structure of -BaB\textsubscript{2}O\textsubscript{4} and LiB\textsubscript{3}O\textsubscript{5} nonlinear optical crystals
RH French, JW Ling, FS Ohuchi, CT Chen
Physical Review B 44 (16), 8496, 1991
Full spectral calculation of non-retarded Hamaker constants for ceramic systems from interband transition strengths
RH French, RM Cannon, LK DeNoyer, YM Chiang
Solid State Ionics 75, 13-33, 1995
Heteroepitaxy of N-type -Ga2O3 thin films on sapphire substrate by low pressure chemical vapor deposition
S Rafique, L Han, AT Neal, S Mou, MJ Tadjer, RH French, H Zhao
Applied Physics Letters 109 (13), 2016
Multiple scattering from rutile TiO2 particles
LE McNeil, RH French
Acta materialia 48 (18-19), 4571-4576, 2000
Optical properties and London dispersion interaction of amorphous and crystalline SiO\textsubscript{2} determined by vacuum ultraviolet
GL Tan, MF Lemon, DJ Jones, RH French
Physical Review-Section B-Condensed Matter 72 (20), 205117-205117, 2005
Optical reflectivity measurements using a laser plasma light source
ML Bortz, RH French
Applied Physics Letters 55 (19), 1955-1957, 1989
The system can't perform the operation now. Try again later.
Articles 1–20