| A unified procedure for fault detection of analog and mixed-mode circuits using magnitude and phase components of the power supply current spectrum DK Papakostas, AA Hatzopoulos IEEE Transactions on instrumentation and measurement 57 (11), 2589-2595, 2008 | 44 | 2008 |
| Analogue fault identification based on power supply current spectrum DK Papakostas, AA Hatzopoulos Electronics Letters 29 (1), 118-119, 1993 | 36 | 1993 |
| Supply current testing in linear bipolar ICs DK Papakostas, AA Hatzopoulos Electronics letters 30 (2), 128-130, 1994 | 32 | 1994 |
| Correlation-based comparison of analog signatures for identification and fault diagnosis DK Papakostas, AA Hatzopoulos IEEE transactions on instrumentation and measurement 42 (4), 860-863, 1993 | 23 | 1993 |
| An improved optical feedback pixel driver circuit NP Papadopoulos, AA Hatzopoulos, DK Papakostas IEEE transactions on electron devices 56 (2), 229-235, 2009 | 20 | 2009 |
| Testing of analogue and mixed-signal circuits by using supply current measurements AA Hatzopoulos, E Iatrou, C Katsaras, DK Papakostas IEE Proceedings-Circuits, Devices and Systems 145 (5), 319-324, 1998 | 19 | 1998 |
| Wavelet energy-based testing using supply current measurements MG Dimopoulos, AD Spyronasios, DK Papakostas, AA Hatzopoulos IET science, measurement & technology 4 (2), 76-85, 2010 | 18 | 2010 |
| Circuit implementation of a supply current spectrum test method MG Dimopoulos, AD Spyronasios, DK Papakostas, DK Konstantinou, ... IEEE Transactions on Instrumentation and Measurement 59 (10), 2660-2670, 2010 | 17 | 2010 |
| Analogue fault detectability comparison between power supply current and output voltage magnitude and phase spectrum components DK Papakostas, AA Hatzopoulos Electronics Letters 40 (8), 457-458, 2004 | 17 | 2004 |
| Design and development of a versatile testing system for analog and mixed-signal circuits MG Dimopoulos, DK Papakostas, AA Hatzopoulos, EI Konstantinidis, ... 2007 18th European Conference on Circuit Theory and Design, 846-849, 2007 | 14 | 2007 |
| Improved analogue fault coverage estimation using probabilistic analysis DK Papakostas, AA Hatzopoulos International Journal of Circuit Theory and Applications 38 (5), 503-514, 2010 | 11 | 2010 |
| Detection of time-delay related faults using Fourier phase components of power supply current DK Papakostas, AA Hatzopoulos Electronics Letters 40 (1), 1, 2004 | 11 | 2004 |
| Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region NP Papadopoulos, AA Hatzopoulos, DK Papakostas, CA Dimitriadis, ... Microelectronics journal 37 (11), 1313-1320, 2006 | 10 | 2006 |
| Analog fault detectability based on statistical circuit analysis DK Papakostas, VC Kosmidis, AA Hatzopoulos Proceedings of Third International Conference on Electronics, Circuits, and …, 1996 | 10 | 1996 |
| Fault detection in linear bipolar ICs: comparative results between power supply current and output voltage measurements DK Papakostas, AA Hatzopoulos Proceedings of IEEE International Symposium on Circuits and Systems-ISCAS'94 …, 1994 | 9 | 1994 |
| Analog and mixed-signal testing by wavelet transformations of power supply current measurements MG Dimopoulos, AD Spyronasios, DK Papakostas, DK Konstantinou, ... 2009 MIXDES-16th International Conference Mixed Design of Integrated …, 2009 | 8 | 2009 |
| Input stimulus comparison using an adaptive FPGA-based testing system PP Sotirios, VD Vassilios, PK Dimitrios, HA Alkis 2014 IEEE International Symposium on Circuits and Systems (ISCAS), 277-280, 2014 | 6 | 2014 |
| Impact of parameter covariance on fault detectability estimation of analogue and mixed-mode circuits DK Papakostas, AA Hatzopoulos IEE Proceedings-Circuits, Devices and Systems 150 (5), 434-438, 2003 | 6 | 2003 |
| Microcontroller-based production-line testing M Dimopoulos, D Papakostas, A Hatzopoulos, E Konstantinidis, ... XXII Conference on Design of Circuits and Integrated Systems (DCIS), 21-23, 2007 | 5 | 2007 |
| Estimation of statistical variables for analogue fault detectability evaluation DK Papakostas, AA Hatzopoulos IEE Proceedings-Circuits, Devices and Systems 146 (6), 350-354, 1999 | 5 | 1999 |
