Παρακολούθηση
Lars Hultman, Professor, PhD
Lars Hultman, Professor, PhD
Linköping University, Department of Physics, IFM
Η διεύθυνση ηλεκτρονικού ταχυδρομείου έχει επαληθευτεί στον τομέα ifm.liu.se
Τίτλος
Παρατίθεται από
Παρατίθεται από
Έτος
Two‐Dimensional Nanocrystals Produced by Exfoliation of Ti3AlC2
M Naguib, M Kurtoglu, V Presser, J Lu, J Niu, M Heon, L Hultman, ...
Advanced materials 23 (37), 4248-4253, 2011
62912011
Two-dimensional transition metal carbides
M Naguib, O Mashtalir, J Carle, V Presser, J Lu, L Hultman, Y Gogotsi, ...
ACS nano 6 (2), 1322-1331, 2012
29392012
Microstructural evolution during film growth
I Petrov, PB Barna, L Hultman, JE Greene
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 21 (5 …, 2003
19252003
New two-dimensional niobium and vanadium carbides as promising materials for Li-ion batteries
M Naguib, J Halim, J Lu, KM Cook, L Hultman, Y Gogotsi, MW Barsoum
Journal of the American Chemical Society 135 (43), 15966-15969, 2013
14472013
Two-dimensional, ordered, double transition metals carbides (MXenes)
B Anasori, Y Xie, M Beidaghi, J Lu, BC Hosler, L Hultman, PRC Kent, ...
ACS nano 9 (10), 9507-9516, 2015
11332015
Microstructural design of hard coatings
PH Mayrhofer, C Mitterer, L Hultman, H Clemens
Progress in materials science 51 (8), 1032-1114, 2006
11032006
The Mn+ 1AXn phases: Materials science and thin-film processing
P Eklund, M Beckers, U Jansson, H Högberg, L Hultman
Thin Solid Films 518 (8), 1851-1878, 2010
10582010
Transparent conductive two-dimensional titanium carbide epitaxial thin films
J Halim, MR Lukatskaya, KM Cook, J Lu, CR Smith, LÅ Näslund, SJ May, ...
Chemistry of Materials 26 (7), 2374-2381, 2014
10142014
X-ray photoelectron spectroscopy: towards reliable binding energy referencing
G Greczynski, L Hultman
Progress in Materials Science 107, 100591, 2020
9332020
Thermal stability of nitride thin films
L Hultman
Vacuum 57 (1), 1-30, 2000
7042000
Self-organized nanostructures in the Ti–Al–N system
PH Mayrhofer, A Hörling, L Karlsson, J Sjölén, T Larsson, C Mitterer, ...
Applied Physics Letters 83 (10), 2049-2051, 2003
6532003
Mechanical properties and machining performance of Ti1− xAlxN-coated cutting tools
A Hörling, L Hultman, M Odén, J Sjölén, L Karlsson
Surface and Coatings Technology 191 (2-3), 384-392, 2005
6132005
Role of nitrogen in the formation of hard and elastic CN x thin films by reactive magnetron sputtering
N Hellgren, MP Johansson, E Broitman, L Hultman, JE Sundgren
Physical Review B 59 (7), 5162, 1999
5181999
Growth, structure, and microhardness of epitaxial TiN/NbN superlattices
M Shinn, L Hultman, SA Barnett
Journal of Materials Research 7 (4), 901-911, 1992
5061992
A general Lewis acidic etching route for preparing MXenes with enhanced electrochemical performance in non-aqueous electrolyte
Y Li, H Shao, Z Lin, J Lu, L Liu, B Duployer, POÅ Persson, P Eklund, ...
Nature Materials 19 (8), 894-899, 2020
5002020
Element replacement approach by reaction with Lewis acidic molten salts to synthesize nanolaminated MAX phases and MXenes
M Li, J Lu, K Luo, Y Li, K Chang, K Chen, J Zhou, J Rosen, L Hultman, ...
Journal of the American Chemical Society 141 (11), 4730-4737, 2019
4922019
C 1s peak of adventitious carbon aligns to the vacuum level: dire consequences for material's bonding assignment by photoelectron spectroscopy
G Greczynski, L Hultman
ChemPhysChem 18 (12), 1507-1512, 2017
4702017
Reliable determination of chemical state in x-ray photoelectron spectroscopy based on sample-work-function referencing to adventitious carbon: resolving the myth of apparent …
G Greczynski, L Hultman
Applied Surface Science 451, 99-103, 2018
4642018
Two-dimensional Mo1. 33C MXene with divacancy ordering prepared from parent 3D laminate with in-plane chemical ordering
Q Tao, M Dahlqvist, J Lu, S Kota, R Meshkian, J Halim, J Palisaitis, ...
Nature communications 8 (1), 1-7, 2017
4522017
Development of preferred orientation in polycrystalline TiN layers grown by ultrahigh vacuum reactive magnetron sputtering
JE Greene, JE Sundgren, L Hultman, I Petrov, DB Bergstrom
Applied physics letters 67 (20), 2928-2930, 1995
4051995
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