| Electronic properties of semiconducting FeSi2 films CA Dimitriadis, JH Werner, S Logothetidis, M Stutzmann, J Weber, ... Journal of applied physics 68 (4), 1726-1734, 1990 | 321 | 1990 |
| Si film electrical characterization in SOI substrates by the HgFET technique HJ Hovel Solid-state electronics 47 (8), 1311-1333, 2003 | 154* | 2003 |
| Performance of thin-film transistors on polysilicon films grown by low-pressure chemical vapor deposition at various pressures CA Dimitriadis, PA Coxon, L Dozsa, L Papadimitriou, N Economou IEEE transactions on electron devices 39 (3), 598-606, 1992 | 134 | 1992 |
| A SEM-EBIC minority-carrier diffusion-length measurement technique DE Ioannou, CA Dimitriadis IEEE Transactions on Electron Devices 29 (3), 445-450, 1982 | 130 | 1982 |
| Semi-analytical modeling of short-channel effects in Si and Ge symmetrical double-gate MOSFETs A Tsormpatzoglou, CA Dimitriadis, R Clerc, Q Rafhay, G Pananakakis, ... IEEE Transactions on Electron devices 54 (8), 1943-1952, 2007 | 117 | 2007 |
| On-current modeling of large-grain polycrystalline silicon thin-film transistors FV Farmakis, J Brini, G Kamarinos, CT Angelis, CA Dimitriadis, ... IEEE Transactions on Electron Devices 48 (4), 701-706, 2001 | 116 | 2001 |
| Threshold voltage model for short-channel undoped symmetrical double-gate MOSFETs A Tsormpatzoglou, CA Dimitriadis, R Clerc, G Pananakakis, G Ghibaudo IEEE Transactions on Electron Devices 55 (9), 2512-2516, 2008 | 114 | 2008 |
| Effect of pressure on the growth of crystallites of low‐pressure chemical‐vapor‐deposited polycrystalline silicon films and the effective electron mobility under high normal … CA Dimitriadis, J Stoemenos, PA Coxon, S Friligkos, J Antonopoulos, ... Journal of applied physics 73 (12), 8402-8411, 1993 | 109 | 1993 |
| Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors CT Angelis, CA Dimitriadis, M Miyasaka, FV Farmakis, G Kamarinos, ... Journal of applied physics 86 (8), 4600-4606, 1999 | 108 | 1999 |
| Anomalous turn-on voltage degradation during hot-carrier stress in polycrystalline silicon thin-film transistors FV Farmakis, J Brini, G Kamarinos, CA Dimitriadis IEEE Electron Device Letters 22 (2), 74-76, 2001 | 92 | 2001 |
| Advances in the electrical assessment of semiconductors using the scanning electron microscope SM Davidson, CA Dimitriadis Journal of microscopy 118 (3), 275-290, 1980 | 91 | 1980 |
| Study of leakage current in -channel and -channel polycrystalline silicon thin-film transistors by conduction and low frequency noise measurements CT Angelis, CA Dimitriadis, I Samaras, J Brini, G Kamarinos, ... Journal of applied physics 82 (8), 4095-4101, 1997 | 82 | 1997 |
| Semianalytical modeling of short-channel effects in lightly doped silicon trigate MOSFETs A Tsormpatzoglou, CA Dimitriadis, R Clerc, G Pananakakis, G Ghibaudo IEEE transactions on electron devices 55 (10), 2623-2631, 2008 | 81 | 2008 |
| Schottky barrier contacts of titanium nitride on n‐type silicon CA Dimitriadis, S Logothetidis, I Alexandrou Applied physics letters 66 (4), 502-504, 1995 | 75 | 1995 |
| Determination of bulk states and interface states distributions in polycrystalline silicon thin‐film transistors CA Dimitriadis, DH Tassis, NA Economou, AJ Lowe Journal of applied physics 74 (4), 2919-2924, 1993 | 75 | 1993 |
| Improved analysis and modeling of low-frequency noise in nanoscale MOSFETs EG Ioannidis, CA Dimitriadis, S Haendler, RA Bianchi, J Jomaah, ... Solid-State Electronics 76, 54-59, 2012 | 74 | 2012 |
| Compact model of drain current in short-channel triple-gate FinFETs N Fasarakis, A Tsormpatzoglou, DH Tassis, I Pappas, K Papathanasiou, ... IEEE transactions on electron devices 59 (7), 1891-1898, 2012 | 67 | 2012 |
| A compact drain current model of short-channel cylindrical gate-all-around MOSFETs A Tsormpatzoglou, DH Tassis, CA Dimitriadis, G Ghibaudo, ... Semiconductor science and technology 24 (7), 075017, 2009 | 67 | 2009 |
| On the threshold voltage and channel conductance of polycrystalline silicon thin‐film transistors CA Dimitriadis, DH Tassis Journal of applied physics 79 (8), 4431-4437, 1996 | 62 | 1996 |
| Growth mechanism and morphology of semiconducting FeSi2 films CA Dimitriadis, JH Werner Journal of applied physics 68 (1), 93-96, 1990 | 62 | 1990 |
