| Influences of evaporation temperature on electronic structures and electrical properties of molybdenum oxide in organic light emitting devices CT Lin, CH Yeh, MH Chen, SH Hsu, CI Wu, TW Pi Journal of Applied Physics 107 (5), 2010 | 37 | 2010 |
| Surface topography and chemistry shape cellular behavior on wide band-gap semiconductors LE Bain, R Collazo, S Hsu, NP Latham, MJ Manfra, A Ivanisevic Acta biomaterialia 10 (6), 2455-2462, 2014 | 31 | 2014 |
| Correlation of energy band alignment and turn-on voltage in organic light emitting diodes IW Wu, YH Chen, PS Wang, CG Wang, SH Hsu, CI Wu Applied Physics Letters 96 (1), 2010 | 27 | 2010 |
| Formation of gap states and enhanced current injection efficiency in organic light emitting diodes incorporated with subphthalocyanine YH Chen, YJ Chang, GR Lee, JH Chang, IW Wu, JH Fang, SH Hsu, ... Organic Electronics 11 (3), 445-449, 2010 | 24 | 2010 |
| Optimization of experimental designs for system-level accelerated life test in a memory system degraded by time-dependent dielectric breakdown DH Kim, SH Hsu, L Milor IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27 (7 …, 2019 | 8 | 2019 |
| Machine learning for detection of competing wearout mechanisms SH Hsu, K Yang, L Milor 2019 IEEE International Reliability Physics Symposium (IRPS), 1-9, 2019 | 5 | 2019 |
| Reliability and accelerated testing of 14nm FinFET ring oscillators SH Hsu, K Yang, L Milor 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS), 1-7, 2019 | 3 | 2019 |
| Extraction of wearout model parameters using on-line test of an SRAM SH Hsu, YY Huang, YD Wu, K Yang, LH Lin, L Milor Microelectronics Reliability 114, 113756, 2020 | 1 | 2020 |
| Optimal accelerated test framework for time-dependent dielectric breakdown lifetime parameter estimation YD Wu, K Yang, SH Hsu, L Milor IEEE Transactions on Very Large Scale Integration (VLSI) Systems 28 (12 …, 2020 | 1 | 2020 |
| Identification of failure modes for circuit samples with confounded causes of failure S Hsu, YY Huang, K Yang, L Milor 2019 IEEE 25th International Symposium on On-Line Testing and Robust System …, 2019 | 1 | 2019 |
| Lifetime estimation using ring oscillators for prediction in FinFET technology S Hsu, K Yang, R Zhang, L Milor 2018 International Integrated Reliability Workshop (IIRW), 1-4, 2018 | 1 | 2018 |
| Optimal sampling for accelerated testing in 14 nm FinFET ring oscillators SH Hsu, YY Huang, YD Wu, K Yang, LH Lin, L Milor Microelectronics Reliability 114, 113753, 2020 | | 2020 |
| Reliability and Data Analysis of Wearout Mechanisms for Circuits SH Hsu Georgia Institute of Technology, 2020 | | 2020 |
