| An electron microscope for the aberration-corrected era OL Krivanek, GJ Corbin, N Dellby, BF Elston, RJ Keyse, MF Murfitt, ... Ultramicroscopy 108 (3), 179-195, 2008 | 375 | 2008 |
| Introduction to scanning transmission electron microscopy R Keyse Routledge, 2018 | 116 | 2018 |
| High-resolution imaging of silicon (111) using a 100 keV STEM XU Peirong, EJ Kirkland, J Silcox, R Keyse Ultramicroscopy 32 (2), 93-102, 1990 | 70 | 1990 |
| Advances in aberration-corrected scanning transmission electron microscopy and electron energy-loss spectroscopy OL Krivanek, N Dellby, RJ Keyse, MF Murfitt, CS Own, ZS Szilagyi, ... Advances in Imaging and Electron Physics: Aberration Corrected Electron …, 2009 | 37 | 2009 |
| Structure and morphology of electroless Ni–P deposits RJ Keyse, C Hammond Materials science and technology 3 (11), 963-972, 1987 | 32 | 1987 |
| Assessment of electron energy-loss spectroscopy below 5 eV in semiconductor materials in a VG STEM U Bangert, AJ Harvey, R Keyse Ultramicroscopy 68 (3), 173-180, 1997 | 28 | 1997 |
| Aberration-corrected STEM: current performance and future directions PD Nellist, MF Chisholm, AR Lupini, A Borisevich, WH Sides Jr, ... Journal of Physics: Conference Series 26 (1), 7, 2006 | 24 | 2006 |
| Advances in Imaging and Electron Physics OL Krivanek, N Dellby, RJ Keyse, MF Murfitt, CS Own, ZS Szilagyi, ... Academic Press, New York 153, 121-160, 2008 | 18 | 2008 |
| Analysis of planar defects in Nb2O5-and Bi2O3-doped BaTiO3 ceramics MA Mccoy, WE Lee, RW Grimes, R Keyse Journal of materials science 33, 5759-5771, 1998 | 16 | 1998 |
| Chemical nature of the luminescent centre in fresh and aged porous silicon layers S Gardelis, U Bangert, B Hamilton, RF Pettifer, DA Hill, R Keyse, ... Applied surface science 102, 408-412, 1996 | 15 | 1996 |
| Stacking fault energy and crystal stability of solid krypton and xenon RJ Keyse, JA Venables Journal of Physics C: Solid State Physics 18 (23), 4435, 1985 | 13 | 1985 |
| Crystal growth and microstructures of solid krypton and xenon RJ Keyse, JA Venables Journal of crystal growth 71 (3), 525-537, 1985 | 11 | 1985 |
| Correlation between microstructure and localized band gap of GaN grown on SiC U Bangert, A Harvey, J Davidson, R Keyse, C Dieker Journal of applied physics 83 (12), 7726-7729, 1998 | 9 | 1998 |
| Highly spatially resolved electron energy‐loss spectroscopy in the bandgap regime of GaN U Bangert, AJ Harvey, D Freundt, R Keyse Journal of Microscopy 188 (3), 237-242, 1997 | 9 | 1997 |
| Highly spatially resolved X-ray analysis of semiconductor alloys and nanostructures in a scanning transmission electron microscope U Bangert, AJ Harvey, C Diekek, A Hartmann, R Keyse Philosophical Magazine A 74 (6), 1421-1437, 1996 | 6 | 1996 |
| An electron-microscope helium stage for use with a side-entry window-type environmental cell RJ Keyse, G Raynerd, JA Venables Journal of Physics E: Scientific Instruments 17 (3), 228, 1984 | 3 | 1984 |
| UltraSTEM progress: flexible electron optics, high-performance sample stage O Krivanek, G Corbin, N Dellby, B Elston, R Keyse, M Murfitt, C Own, ... Microscopy and Microanalysis 13 (S02), 878-879, 2007 | 2 | 2007 |
| HIGH-RESOLUTION STEM INSTRUMENTATION RJ Keyse INSTITUTE OF PHYSICS CONFERENCE SERIES, 367-370, 1990 | 2 | 1990 |
| Electron Energy Loss Spectroscopy in the 2–5 eV Regime U Bangert, A Harvey, R Keyse, C Dicker Electron Microscopy and Analysis 1997, Proceedings of the Institute of …, 2022 | 1 | 2022 |
| High-stability, highly automated double-eucentric (S) TEM sample stage CS Own, GJ Corbin, N Dellby, BF Elston, RJ Keyse, MF Murfitt, ... Microscopy and Microanalysis 12 (S02), 1104-1105, 2006 | 1 | 2006 |
