Dimitris Gizopoulos
Title
Cited by
Cited by
Year
Microprocessor software-based self-testing
M Psarakis, D Gizopoulos, E Sanchez, MS Reorda
IEEE Design & Test of Computers 27 (3), 4-19, 2010
2792010
Software-based self-testing of embedded processors
N Kranitis, A Paschalis, D Gizopoulos, G Xenoulis
Processor design, 447-481, 2007
2362007
Effective software-based self-test strategies for on-line periodic testing of embedded processors
A Paschalis, D Gizopoulos
IEEE Transactions on Computer-aided design of integrated circuits and …, 2004
1672004
Architectures for online error detection and recovery in multicore processors
D Gizopoulos, M Psarakis, SV Adve, P Ramachandran, SKS Hari, D Sorin, ...
2011 Design, Automation & Test in Europe, 1-6, 2011
1442011
Advances in electronic testing: challenges and methodologies
D Gizopoulos
Springer 27, 1, 2006
1422006
Systematic software-based self-test for pipelined processors
D Gizopoulos, M Psarakis, M Hatzimihail, M Maniatakos, A Paschalis, ...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 16 (11 …, 2008
1092008
Guest editors' introduction: Design for yield and reliability
Y Zorian, D Gizopoulos, C Vandenberg, P Magarshack
IEEE Design & Test of Computers 21 (3), 177-182, 2004
1042004
Reliability challenges of real-time systems in forthcoming technology nodes
S Hamdioui, D Gizopoulos, G Guido, M Nicolaidis, A Grasset, P Bonnot
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 129-134, 2013
832013
Instruction-based self-testing of processor cores
N Kranitis, A Paschalis, D Gizopoulos, Y Zorian
Journal of Electronic Testing 19 (2), 103-112, 2003
822003
Low power/energy BIST scheme for datapaths
D Gizopoulos, N Krantitis, A Paschalis, M Psarakis, Y Zorian
Proceedings 18th IEEE VLSI Test Symposium, 23-28, 2000
812000
Hybrid-SBST methodology for efficient testing of processor cores
N Kranitis, A Merentitis, G Theodorou, A Paschalis, D Gizopoulos
IEEE Design & Test of Computers 25 (1), 64-75, 2008
762008
Deterministic software-based self-testing of embedded processor cores
A Paschalis, D Gizopoulos, N Kranitis, M Psarakis, Y Zorian
Proceedings Design, Automation and Test in Europe. Conference and Exhibition …, 2001
722001
A concurrent built-in self-test architecture based on a self-testing RAM
I Voyiatzis, A Paschalis, D Gizopoulos, N Kranitis, C Halatsis
IEEE Transactions on Reliability 54 (1), 69-78, 2005
702005
Differential fault injection on microarchitectural simulators
M Kaliorakis, S Tselonis, A Chatzidimitriou, N Foutris, D Gizopoulos
2015 IEEE international symposium on workload characterization, 172-182, 2015
692015
Effective software self-test methodology for processor cores
N Kranitis, A Paschalis, D Gizopoulos, Y Zorian
Proceedings 2002 Design, Automation and Test in Europe Conference and …, 2002
692002
Harnessing voltage margins for energy efficiency in multicore CPUs
G Papadimitriou, M Kaliorakis, A Chatzidimitriou, D Gizopoulos, ...
Proceedings of the 50th Annual IEEE/ACM International Symposium on …, 2017
642017
Embedded processor-based self-test
D Gizopoulos, A Paschalis, Y Zorian
Springer Science & Business Media, 2004
562004
Application and analysis of rt-level software-based self-testing for embedded processor cores
N Kranitis, G Xenoulis, A Paschalis, D Gizopoulos, Y Zorian
International Test Conference, 2003. Proceedings. ITC 2003. 1, 431-440, 2003
552003
Systematic software-based self-test for pipelined processors
M Psarakis, D Gizopoulos, M Hatzimihail, A Paschalis, A Raghunathan, ...
2006 43rd ACM/IEEE Design Automation Conference, 393-398, 2006
542006
An effective built-in self-test scheme for parallel multipliers
D Gizopoulos, A Paschalis, Y Zorian
IEEE Transactions on Computers 48 (9), 936-950, 1999
531999
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Articles 1–20