Παρακολούθηση
Ioannis Kopsalis
Ioannis Kopsalis
University of Birmingham - STFC Rutherford Appleton Laboratory
Η διεύθυνση ηλεκτρονικού ταχυδρομείου έχει επαληθευτεί στον τομέα stfc.ac.uk - Αρχική σελίδα
Τίτλος
Παρατίθεται από
Παρατίθεται από
Έτος
Design and first tests of a radiation-hard pixel sensor for the European X-ray Free-Electron Laser
J Schwandt, E Fretwurst, R Klanner, I Kopsalis, J Zhang
2013 14th European Conference on Radiation and Its Effects on Components and …, 2013
172013
The influence of edge effects on the determination of the doping profile of silicon pad diodes
E Fretwurst, E Garutti, M Hufschmidt, R Klanner, I Kopsalis, J Schwandt
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2017
11*2017
Study of X-ray radiation damage in the AGIPD sensor for the European XFEL
J Zhang, E Fretwurst, H Graafsma, R Klanner, I Kopsalis, J Schwandt
Journal of Instrumentation 9 (05), C05022, 2014
112014
Surface effects in segmented silicon sensors
J Schwandt, E Fretwurst, E Garutti, R Klanner, I Kopsalis
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2017
92017
Charge collection study with the ATLAS ITk prototype silicon strip sensors ATLAS17LS
K Hara, SH Abidi, AA Affolder, P Allport, MJ Basso, A Casha, V Cindro, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2020
72020
X-ray induced radiation damage in segmented p+ n silicon sensors
J Zhang, E Fretwurst, R Klanner, J Schwandt, J Becker, I Kopsalis, ...
PoS (Vertex 2012) 19, 2013
62013
Probing high‐energy ion‐implanted silicon by micro‐Raman spectroscopy
I Kopsalis, V Paneta, M Kokkoris, E Liarokapis, M Erich, S Petrović, ...
Journal of Raman Spectroscopy 45 (8), 650-656, 2014
42014
Investigation of deep implanted carbon and oxygen channeling profiles in [1 1 0] silicon, using d-NRA and SEM
V Paneta, M Erich, S Fazinić, M Kokkoris, I Kopsalis, S Petrović, T Tadić
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014
42014
First tests of a reconfigurable depleted MAPS sensor for digital electromagnetic calorimetry
PP Allport, R Bosley, J Dopke, S Flynn, L Gonella, I Kopsalis, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2020
32020
Determination of the p-spray profile for n+ p silicon sensors using a MOSFET
E Fretwurst, E Garutti, R Klanner, I Kopsalis, J Schwandt, M Weberpals
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2017
32017
Surface Effects in Segmented Silicon Sensors
I Kopsalis
Staats-und Universitätsbibliothek Hamburg Carl von Ossietzky, 2017
32017
Quality Assurance methodology for the ATLAS Inner Tracker strip sensor production
M Ullán, P Allport, K Dette, V Fadeyev, J Fernández-Tejero, C Fleta, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2020
12020
DECAL: A Reconfigurable Monolithic Active Pixel Sensor for use in Calorimetry and Tracking
S Benhammadi, J Dopke, N Guerrini, P Phillips, I Sedgwick, G Villani, ...
Topical Workshop on Electronics for Particle Physics 2, 6, 2019
12019
Measurement of the electric-field and time dependence of the effective oxide-charge density of the Si-SiO2 system
I Kopsalis, R Klanner, J Schwandt
Journal of Instrumentation 11 (02), C02017, 2016
12016
Investigation of the insulator layers for segmented silicon sensors before and after X-ray irradiation
D Brueske, E Garutti, R Klanner, I Kopsalis, J Schwandt, KT That, J Zhang
2014 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC …, 2014
12014
A reconfigurable CMOS sensor for tracking, pre-shower and digital electromagnetic calorimetry
P Allport, S Benhammadi, R Bosley, J Dopke, S Flynn, P Freeman, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2020
2020
Performance characterisation results of HV/HR CMOS devices
I Kopsalis, S Worm
2020
Quality Assurance methodology for the ATLAS ITk Strip Sensor Production
M Ullán Comes, R Orr, L Gonella, CM Fleta Corral, J Fernandez Tejero, ...
ATL-COM-ITK-2019-053, 2019
2019
X-ray dose and electric field dependence of oxide charges at the Si-SiO2 interface of high-ohmic Si
I Kopsalis, E Fretwurst, E Garutti, R Klanner, J Schwandt
Verhandlungen der Deutschen Physikalischen Gesellschaft, 2017
2017
X-ray irradiation effects of interface traps and trapped-oxide charge at the Si-SiO_2 interface of segmented silicon sensors
I Kopsalis, E Fretwurst, E Garutti, R Klanner, J Schwandt
Verhandlungen der Deutschen Physikalischen Gesellschaft, 2016
2016
Δεν είναι δυνατή η εκτέλεση της ενέργειας από το σύστημα αυτή τη στιγμή. Προσπαθήστε ξανά αργότερα.
Άρθρα 1–20