| Analog performance locking through neural network-based biasing G Volanis, Y Lu, SGR Nimmalapudi, A Antonopoulos, A Marshall, ... 2019 IEEE 37th VLSI Test Symposium (VTS), 1-6, 2019 | 38 | 2019 |
| A comparative study of one-shot statistical calibration methods for analog/RF ICs Y Lu, KS Subramani, H Huang, N Kupp, K Huang, Y Makris 2015 IEEE International Test Conference (ITC), 1-10, 2015 | 33 | 2015 |
| Range-controlled floating-gate transistors: A unified solution for unlocking and calibrating analog ICs SGR Nimmalapudi, G Volanis, Y Lu, A Antonopoulos, A Marshall, ... 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 286-289, 2020 | 22 | 2020 |
| On-die learning-based self-calibration of analog/RF ICs G Volanis, D Maliuk, Y Lu, KS Subramani, A Antonopoulos, Y Makris 2016 IEEE 34th VLSI Test Symposium (VTS), 1-6, 2016 | 18 | 2016 |
| Post-production calibration of analog/rf ics: Recent developments and a fully integrated solution A Antonopoulos, G Volanis, Y Lu, Y Makris 2019 16th International Conference on Synthesis, Modeling, Analysis and …, 2019 | 7 | 2019 |
| On the use of bayesian networks for resource-efficient self-calibration of analog/RF ICs M Andraud, L Galindez, Y Lu, Y Makris, M Verhelst 2018 IEEE International Test Conference (ITC), 1-10, 2018 | 5 | 2018 |
| Silicon demonstration of statistical post-production tuning Y Lu, K Subramani, H Huang, N Kupp, Y Makris 2015 IEEE computer society annual symposium on VLSI, 628-633, 2015 | 5 | 2015 |
| Knob non-idealities in learning-based post-production tuning of analog/RF ICs: Impact & remedies Y Lu, G Volanis, KS Subramani, A Antonopoulos, Y Makris 2017 IEEE 35th VLSI Test Symposium (VTS), 1-6, 2017 | 1 | 2017 |
| Utilization of Post-fabrication Calibration in Thwarting Process Variation and Analog IP Piracy Y Lu | | 2021 |
| An evaluation platform for post-production calibration of analog/RF ICs Y Lu The University of Texas at Dallas, 2014 | | 2014 |
