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Lloyd Massengill
Lloyd Massengill
Verified email at vanderbilt.edu
Title
Cited by
Cited by
Year
Basic mechanisms and modeling of single-event upset in digital microelectronics
PE Dodd, LW Massengill
IEEE Transactions on nuclear Science 50 (3), 583-602, 2003
14312003
Charge collection and charge sharing in a 130 nm CMOS technology
OA Amusan, AF Witulski, LW Massengill, BL Bhuva, PR Fleming, ML Alles, ...
IEEE Transactions on nuclear science 53 (6), 3253-3258, 2006
4732006
Single event transients in digital CMOS—A review
V Ferlet-Cavrois, LW Massengill, P Gouker
IEEE Transactions on Nuclear Science 60 (3), 1767-1790, 2013
4102013
Monte Carlo simulation of single event effects
RA Weller, MH Mendenhall, RA Reed, RD Schrimpf, KM Warren, ...
IEEE Transactions on Nuclear Science 57 (4), 1726-1746, 2010
2792010
Characterization of digital single event transient pulse-widths in 130-nm and 90-nm CMOS technologies
B Narasimham, BL Bhuva, RD Schrimpf, LW Massengill, MJ Gadlage, ...
IEEE Transactions on Nuclear Science 54 (6), 2506-2511, 2007
2242007
Simultaneous single event charge sharing and parasitic bipolar conduction in a highly-scaled SRAM design
BD Olson, DR Ball, KM Warren, LW Massengill, NF Haddad, SE Doyle, ...
IEEE transactions on nuclear science 52 (6), 2132-2136, 2005
2112005
Impact of scaling on soft-error rates in commercial microprocessors
N Seifert, X Zhu, LW Massengill
IEEE Transactions on Nuclear Science 49 (6), 3100-3106, 2002
2022002
Single-event transient pulse quenching in advanced CMOS logic circuits
JR Ahlbin, LW Massengill, BL Bhuva, B Narasimham, MJ Gadlage, ...
IEEE Transactions on Nuclear Science 56 (6), 3050-3056, 2009
1982009
The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM
KM Warren, RA Weller, MH Mendenhall, RA Reed, DR Ball, CL Howe, ...
IEEE transactions on nuclear science 52 (6), 2125-2131, 2005
1942005
A bias-dependent single-event compact model implemented into BSIM4 and a 90 nm CMOS process design kit
JS Kauppila, AL Sternberg, ML Alles, AM Francis, J Holmes, OA Amusan, ...
IEEE Transactions on nuclear Science 56 (6), 3152-3157, 2009
1922009
Comparison of combinational and sequential error rates for a deep submicron process
NN Mahatme, S Jagannathan, TD Loveless, LW Massengill, BL Bhuva, ...
IEEE Transactions on Nuclear Science 58 (6), 2719-2725, 2011
1862011
SEU modeling and prediction techniques
LW Massengill
IEEE NSREC Short Course 3, 1-93, 1993
1791993
Models and algorithmic limits for an ECC-based approach to hardening sub-100-nm SRAMs
MA Bajura, Y Boulghassoul, R Naseer, S DasGupta, AF Witulski, ...
IEEE Transactions on Nuclear Science 54 (4), 935-945, 2007
1782007
Neutron-and proton-induced single event upsets for D-and DICE-flip/flop designs at a 40 nm technology node
TD Loveless, S Jagannathan, T Reece, J Chetia, BL Bhuva, MW McCurdy, ...
IEEE Transactions on Nuclear Science 58 (3), 1008-1014, 2011
1742011
On-chip characterization of single-event transient pulsewidths
B Narasimham, V Ramachandran, BL Bhuva, RD Schrimpf, AF Witulski, ...
IEEE Transactions on Device and Materials Reliability 6 (4), 542-549, 2006
1692006
RHBD techniques for mitigating effects of single-event hits using guard-gates
A Balasubramanian, BL Bhuva, JD Black, LW Massengill
IEEE Transactions on Nuclear Science 52 (6), 2531-2535, 2005
1682005
A hardened-by-design technique for RF digital phase-locked loops
TD Loveless, LW Massengill, BL Bhuva, WT Holman, AF Witulski, ...
IEEE transactions on nuclear science 53 (6), 3432-3438, 2006
1422006
Impact of ion energy and species on single event effects analysis
RA Reed, RA Weller, MH Mendenhall, JM Lauenstein, KM Warren, ...
IEEE Transactions on Nuclear Science 54 (6), 2312-2321, 2007
1412007
Single event upsets in deep-submicrometer technologies due to charge sharing
OA Amusan, LW Massengill, MP Baze, AL Sternberg, AF Witulski, ...
IEEE Transactions on Device and Materials Reliability 8 (3), 582-589, 2008
1402008
HBD layout isolation techniques for multiple node charge collection mitigation
JD Black, AL Sternberg, ML Alles, AF Witulski, BL Bhuva, LW Massengill, ...
IEEE transactions on nuclear science 52 (6), 2536-2541, 2005
1352005
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