| Advanced computing in electron microscopy EJ Kirkland Plenum Press, 1998 | 1803 | 1998 |
| Simulation of annular dark field STEM images using a modified multislice method EJ Kirkland, RF Loane, J Silcox Ultramicroscopy 23 (1), 77-96, 1987 | 401 | 1987 |
| Improved high resolution image processing of bright field electron micrographs: I. Theory EJ Kirkland Ultramicroscopy 15 (3), 151-172, 1984 | 235 | 1984 |
| Visibility of single heavy atoms on thin crystalline silicon in simulated annular dark-field STEM images RF Loane, EJ Kirkland, J Silcox Acta Crystallographica Section A: Foundations of Crystallography 44 (6), 912-927, 1988 | 216 | 1988 |
| Simulation of thermal diffuse scattering including a detailed phonon dispersion curve DA Muller, B Edwards, EJ Kirkland, J Silcox Ultramicroscopy 86 (3-4), 371-380, 2001 | 146 | 2001 |
| Spatial distribution of competing ions around DNA in solution K Andresen, R Das, HY Park, H Smith, LW Kwok, JS Lamb, EJ Kirkland, ... Physical review letters 93 (24), 248103, 2004 | 131 | 2004 |
| Depth-dependent imaging of individual dopant atoms in silicon PM Voyles, DA Muller, EJ Kirkland Microscopy and Microanalysis 10 (2), 291-300, 2004 | 101 | 2004 |
| Room design for high-performance electron microscopy DA Muller, EJ Kirkland, MG Thomas, JL Grazul, L Fitting, M Weyland Ultramicroscopy 106 (11-12), 1033-1040, 2006 | 91 | 2006 |
| Improved high resolution image processing of bright field electron micrographs: II. Experiment EJ Kirkland, BM Siegel, N Uyeda, Y Fujiyoshi Ultramicroscopy 17 (2), 87-103, 1985 | 79 | 1985 |
| Effects of tilt on high-resolution ADF-STEM imaging SE Maccagnano-Zacher, KA Mkhoyan, EJ Kirkland, J Silcox Ultramicroscopy 108 (8), 718-726, 2008 | 77 | 2008 |
| High-resolution imaging of silicon (111) using a 100 keV STEM XU Peirong, EJ Kirkland, J Silcox, R Keyse Ultramicroscopy 32 (2), 93-102, 1990 | 70 | 1990 |
| Effects of amorphous layers on ADF-STEM imaging KA Mkhoyan, SE Maccagnano-Zacher, EJ Kirkland, J Silcox Ultramicroscopy 108 (8), 791-803, 2008 | 68 | 2008 |
| Nonlinear high resolution image processing of conventional transmission electron micrographs: I. Theory EJ Kirkland Ultramicroscopy 9 (1-2), 45-64, 1982 | 66* | 1982 |
| Separation of bulk and surface-losses in low-loss EELS measurements in STEM KA Mkhoyan, T Babinec, SE Maccagnano, EJ Kirkland, J Silcox Ultramicroscopy 107 (4-5), 345-355, 2007 | 65 | 2007 |
| Digital reconstruction of bright field phase contrast images from high resolution electron micrographs EJ Kirkland, BM Siegel, N Uyeda, Y Fujiyoshi Ultramicroscopy 5 (4), 479-503, 1980 | 63 | 1980 |
| A high efficiency annular dark field detector for STEM EJ Kirkland, MG Thomas Ultramicroscopy 62 (1-2), 79-88, 1996 | 55 | 1996 |
| Annular dark field electron microscope images with better than 2 Å resolution at 100 kV DH Shin, EJ Kirkland, J Silcox Applied physics letters 55 (23), 2456-2458, 1989 | 54 | 1989 |
| Computation in electron microscopy EJ Kirkland Acta Crystallographica Section A: Foundations and Advances 72 (1), 1-27, 2016 | 40 | 2016 |
| On the optimum probe in aberration corrected ADF-STEM EJ Kirkland Ultramicroscopy 111 (11), 1523-1530, 2011 | 35 | 2011 |
| An image and spectrum acquisition system for a VG HB501 STEM using a color graphics workstation EJ Kirkland Ultramicroscopy 32 (4), 349-364, 1990 | 35 | 1990 |
David A MullerProfessor of Applied and Engineering Physics, Cornell UniversityVerified email at cornell.edu
